Abstract: A system includes a power management unit that may monitor the power consumed by a processor including a plurality of processor core. The power management unit may throttle or reduce the operating frequency of the processor cores by applying a number of throttle events in response to determining that the plurality of cores is operating above a predetermined power threshold during a given monitoring cycle. The number of throttle events may be based upon a relative priority of each of the plurality of processor cores to one another and an amount that the processor is operating above the predetermined power threshold. The number of throttle events may correspond to a portion of a total number of throttle events, and which may be dynamically determined during operation based upon a proportionality constant and the difference between the total power consumed by the processor and a predetermined power threshold.

Abstract: A system includes a power management unit that may monitor the power consumed by a processor including a plurality of processor core. The power management unit may throttle or reduce the operating frequency of the processor cores by applying a number of throttle events in response to determining that the plurality of cores is operating above a predetermined power threshold during a given monitoring cycle. The number of throttle events may be based upon a relative priority of each of the plurality of processor cores to one another and an amount that the processor is operating above the predetermined power threshold. The number of throttle events may correspond to a portion of a total number of throttle events, and which may be dynamically determined during operation based upon a proportionality constant and the difference between the total power consumed by the processor and a predetermined power threshold.

Abstract: An integrated circuit that includes a digitally controlled oscillator (DCO) that adjusts a clock frequency of a critical path of the integrated circuit based on the variations in a power-supply voltage of the DCO and the critical path is described. This DCO may be included in a feedback control loop that includes a frequency-locked loop (FLL), and which determines an average clock frequency of the critical path based on a reference frequency. Furthermore, the DCO may have a selectable delay characteristic that specifies a delay sensitivity of the DCO as a function of the power-supply voltage, thereby approximately matching a manufactured delay characteristic of the critical path. Additionally, for variations in the power-supply voltage having frequencies greater than a resonance frequency associated with a chip package of the integrated circuit, adjustments of the clock frequency may be proportional to the variations in the power-supply voltage and the selectable delay characteristic.

Abstract: An integrated circuit that includes a digitally controlled oscillator (DCO) that adjusts a clock frequency of a critical path of the integrated circuit based on the variations in a power-supply voltage of the DCO and the critical path is described. This DCO may be included in a feedback control loop that includes a frequency-locked loop (FLL), and which determines an average clock frequency of the critical path based on a reference frequency. Furthermore, the DCO may have a selectable delay characteristic that specifies a delay sensitivity of the DCO as a function of the power-supply voltage, thereby approximately matching a manufactured delay characteristic of the critical path. Additionally, for variations in the power-supply voltage having frequencies greater than a resonance frequency associated with a chip package of the integrated circuit, adjustments of the clock frequency may be proportional to the variations in the power-supply voltage and the selectable delay characteristic.

Abstract: A voltage droop monitoring and correcting circuit for a microprocessor includes: a monitor circuit configured to monitor voltage droops of the microprocessor and perform a temporary clock-skipping technique to compensate for the voltage droops. A method for monitoring and correcting voltage droops of a microprocessor includes: monitoring voltage droops of the microprocessor; and performing a temporary clock-skipping technique to compensate for the voltage droops. A computer system includes memory; a processor operatively connected to the memory; and computer-readable instructions stored in the memory for causing the processor to: monitor voltage droops of the microprocessor; and perform a temporary clock-skipping technique to compensate for the voltage droops.

Abstract: A method for compensating negative bias temperature instability (NBTI) effects on a given model of transistors includes monitoring the NBTI effects on the transistors over time, determining a change in a threshold voltage of the transistors over time based on the monitoring, determining a forward bias voltage based on the change in threshold voltage, and applying the forward bias voltage to the transistors over time. The method may further include storing the monitoring results in a lookup table, and adjusting the forward bias voltage based on the lookup table. The monitoring may include emulating the NBTI effects on a system comprising a plurality of semiconductor devices in which the transistors are used.

Abstract: A voltage droop monitoring and correcting circuit for a microprocessor includes: a monitor circuit configured to monitor voltage droops of the microprocessor and perform a temporary clock-skipping technique to compensate for the voltage droops. A method for monitoring and correcting voltage droops of a microprocessor includes: monitoring voltage droops of the microprocessor; and performing a temporary clock-skipping technique to compensate for the voltage droops. A computer system includes memory; a processor operatively connected to the memory; and computer-readable instructions stored in the memory for causing the processor to: monitor voltage droops of the microprocessor; and perform a temporary clock-skipping technique to compensate for the voltage droops.

Abstract: A method for compensating negative bias temperature instability (NBTI) effects on a given model of transistors includes monitoring the NBTI effects on the transistors over time, determining a change in a threshold voltage of the transistors over time based on the monitoring, determining a forward bias voltage based on the change in threshold voltage, and applying the forward bias voltage to the transistors over time. The method may further include storing the monitoring results in a lookup table, and adjusting the forward bias voltage based on the lookup table. The monitoring may include emulating the NBTI effects on a system comprising a plurality of semiconductor devices in which the transistors are used.

Abstract: One embodiment of the present invention provides a system that efficiently conducts vibrational characterizations for a computer system having variable component configurations. During operation, the system receives a given component configuration associated with the computer system. Next, the system looks up the given component configuration in a resonant spectra library, which contains structural resonant frequencies for a number of possible component configurations for the computer system. If the given component configuration is found in the resonant spectra library, the system retrieves a set of structural resonant frequencies associated with the given component configuration. The system subsequently controls one or more vibration sources within the computer system to avoid the set of structural resonant frequencies.

Abstract: A modified high-speed flip-flop including an input circuit, a smart window circuit, a smart keeper circuit, a pre-charge circuit, a discharge circuit, a slave storage circuit, and an output circuit. Additionally, a circuit including the modified high-speed flip-flop, the circuit also including a non-zero operating voltage provided to the flip-flop, a common voltage provided to the flip-flop, a clock signal input to the flip-flop, a data signal input to the flip-flop wherein the data signal has a high state and a low state, and an output signal from the flip-flop wherein the output signal has a high state and a low state.

Abstract: One embodiment of the present invention provides a system that efficiently conducts vibrational characterizations for a computer system having variable component configurations. During operation, the system receives a given component configuration associated with the computer system. Next, the system looks up the given component configuration in a resonant spectra library, which contains structural resonant frequencies for a number of possible component configurations for the computer system. If the given component configuration is found in the resonant spectra library, the system retrieves a set of structural resonant frequencies associated with the given component configuration. The system subsequently controls one or more vibration sources within the computer system to avoid the set of structural resonant frequencies.

Abstract: Performance of an integrated circuit design, whether embodied as a design encoding or as a fabricated integrated circuit, can be improved by selectively substituting low Vt transistors in a way that prioritizes substitution opportunities based on multi-path timing analysis and evaluates such opportunities based on one or more substitution constraints. By valuing, in a prioritization of substitution opportunities, contributions for all or substantially all timing paths through the substitution opportunity that violate a max-time constraint, repeated passes through a timing analysis phase can be advantageously avoided or limited. In addition, by recognizing one or more constraints on actual low Vt substitutions, particular noise-oriented. constraints, the scope of post substitution design analysis can be greatly reduced. In some realizations, substitutions are performed so long as a leakage current budget is not expended.