Patents by Inventor Gerald Cadloni

Gerald Cadloni has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Threshold voltage offset bin selection based on die family in memory devices
    Patent number: 11791004
    Abstract: A method includes associating, by a processing device, a set of dies of a block family with a die family, wherein the block family is associated with a first threshold voltage offset bin for voltage offsets to be applied in a read operation; and responsive to detecting a triggering event, associating each die of the set of dies with a second threshold voltage offset bin for voltage offsets to be applied in a read operation, wherein the second threshold voltage offset bin is selected based on a representative die of the set of dies associated with the die family.
    Type: Grant
    Filed: December 14, 2022
    Date of Patent: October 17, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Michael Sheperek, Bruce A. Liikanen, Steve Kientz, Anita Ekren, Gerald Cadloni
  • THRESHOLD VOLTAGE OFFSET BIN SELECTION BASED ON DIE FAMILY IN MEMORY DEVICES
    Publication number: 20230115960
    Abstract: A method includes associating, by a processing device, a set of dies of a block family with a die family, wherein the block family is associated with a first threshold voltage offset bin for voltage offsets to be applied in a read operation; and responsive to detecting a triggering event, associating each die of the set of dies with a second threshold voltage offset bin for voltage offsets to be applied in a read operation, wherein the second threshold voltage offset bin is selected based on a representative die of the set of dies associated with the die family.
    Type: Application
    Filed: December 14, 2022
    Publication date: April 13, 2023
    Inventors: Michael Sheperek, Bruce A. Liikanen, Steve Kientz, Anita Ekren, Gerald Cadloni
  • Threshold voltage offset bin selection based on die family in memory devices
    Patent number: 11545227
    Abstract: A measure associated with a characteristic of a die of a memory device is obtained. It is determined whether the measure satisfies a first criterion to group one or more die into a first die family. If it is determined that the measure satisfies the first criterion, the die is associated with the first die family.
    Type: Grant
    Filed: October 14, 2020
    Date of Patent: January 3, 2023
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Michael Sheperek, Bruce A. Liikanen, Steve Kientz, Anita Ekren, Gerald Cadloni
  • THRESHOLD VOLTAGE OFFSET BIN SELECTION BASED ON DIE FAMILY IN MEMORY DEVICES
    Publication number: 20220115079
    Abstract: A measure associated with a characteristic of a die of a memory device is obtained. It is determined whether the measure satisfies a first criterion to group one or more die into a first die family. If it is determined that the measure satisfies the first criterion, the die is associated with the first die family.
    Type: Application
    Filed: October 14, 2020
    Publication date: April 14, 2022
    Inventors: Michael Sheperek, Bruce A. Liikanen, Steve Kientz, Anita Ekren, Gerald Cadloni