Abstract: A design method places power gates or switch cells using unoccupied locations of logic cell rows. Two types of such switch cells, filler switches and sealer switches, may be provided using the unoccupied locations. In one embodiment, virtual ground voltage references to the logic cells are routed to their associated switch cells. Because conventional standard cell design and placement techniques achieve only a placement density or utilization between 70-80% (i.e., unoccupied space constitutes between 20 to 30% of the available space in each row of logic cells), by placing the power gate cells in the unoccupied space, the method does not increase the silicon real estate requirement even though the power gate cells are introduced into the design. Optimization techniques may be applied to achieve proper sizing and distribution of power gate cells, so as to avoid a performance penalty due to the power gate cells.

Abstract: A method and a structure provide a space efficient integrated circuit using standard cells and power gating by switch cells. The standard cells may be tapless, i.e., not provided a substrate connection to a power supply or ground rail by a tap within the cell. The substrate connection for these standard cells may be provided by the switch cells or by specialized tap cells. The tapless standard cells may include only a context-sensitive rail, which may be configured to be a virtual ground rail by a power gating connection to a switch cell or by a direct connection to a power supply or ground rail.

Abstract: A design method places power gates or switch cells using unoccupied locations of logic cell rows. Two types of such switch cells, filler switches and sealer switches, may be provided using the unoccupied locations. In one embodiment, virtual ground voltage references to the logic cells are routed to their associated switch cells. Because conventional standard cell design and placement techniques achieve only a placement density or utilization between 70-80% (i.e., unoccupied space constitutes between 20 to 30% of the available space in each row of logic cells), by placing the power gate cells in the unoccupied space, the method does not increase the silicon real estate requirement even though the power gate cells are introduced into the design. Optimization techniques may be applied to achieve proper sizing and distribution of power gate cells, so as to avoid a performance penalty due to the power gate cells.

Abstract: A method and a design automation tool are provided for use in conjunction with designing logic circuits that implement virtual power signals. The method includes providing in a model for each virtual power signal an attribute that distinguishes the virtual power signal from both a logic signal and a power signal. The method also includes one or more circuit analysis, processing and synthesis tool that takes advantage of such an attribute. That is, within the design automation tool, capabilities are provided so that a virtual power signal may be processed in some instances as a logic signal, and at some instance as indistinguishable to a power rail signal or reference.

Abstract: This invention provides a mechanism for minimizing the switching time degradation of MTCMOS circuits while at the same time minimizing the area overhead due to the MTCMOS switch circuitry. This optimization is achieved by scheduling the current flow, due to the switching events of the MTCMOS logic cells, such that only temporally mutually exclusive currents, or currents whose cumulative sum is less than a predetermined value, can flow in any given switch cell. Techniques for current event merging and current event culling, and techniques for handling timing and current variances may be used.

Abstract: A current waveform for an electronic circuit is calculated from a description of the circuit at a given level of abstraction without requiring a detailed simulation. In one embodiment, the waveform is estimated without using test vectors, and uses an analysis time step or “granularity” that is much shorter than a clock cycle. The method is applicable for calculating worst-case instantaneous current.