Abstract: A method of removing supporting structures from an object produced by an additive manufacturing process is presented, in which a supporting structure is provided between a target structure and a base plate and has a connection thereto, and one of the connections is released by excitation using mechanical vibrations. To enable a more efficient and safer removal of the supporting structures without damaging the elements of the object themselves, by way of the use of an actuator coupled to the target structure or an intermediate element, one mechanical excitation vibration is introduced and is excited with a resonance vibration in order to release the one connection in that the deflection of the resonance vibration exceeds the load limit of the supporting structure.

Abstract: A circuit arrangement can have a number of integrated circuit components, which are arranged on a carrier substrate. A reception circuit for receiving a control signal can be coupled to one of the connection pads on the input side and can be connected to each of the circuit components on the output side. A bridging circuit controlled by a test mode signal can electrically bridge the reception circuit. In a testing method, a plurality of connection pads can be connected to a first potential and at least one of the connection pads can be connected to a second potential. The bridging circuit can be activated and the current measured, by a test arrangement, at the at least one of the connection pads. Inspection for leakage currents in connections between input-side reception circuits and the circuit components can be measured.

Abstract: An integrated chip has a clock signal input (1.1) for application of a first clock signal (clk1) and a clock signal output (1.2–1.5). Moreover, it has a phase locked loop (2), which, on the input side, is connected to the clock signal input (1.1) and serves far generating a second clock signal (clk2). Furthermore, the chip has a multiplexer (MUX), via which the first clock signal (clk1) or the second clock signal (clk2) can optionally be switched to the clock signal output (1.2–1.5), and a unit for frequency monitoring (3), which, on the input side, is connected to the clock signal input (1.1) and is designed and can be operated in such a way that, in the event of a limiting frequency (fmin) being undershot, the multiplexer (MUX) is caused to switch the first clock signal (clk1) to the clock signal output (1.2–1.5).

Abstract: The integrated chip according to the invention has a clock signal input (1.1) for application of a first clock signal (clk1) and a clock signal output (1.2-1.5). Moreover, it has a phase locked loop (2), which, on the input side, is connected to the clock signal input (1.1) and serves for generating a second clock signal (clk2). Furthermore, the chip has a multiplexer (MUX), via which the first clock signal (clk1) or the second clock signal (clk2) can optionally be switched to the clock signal output (1.2-1.5), and a unit for frequency monitoring (3), which, on the input side, is connected to the clock signal input (1.1) and is designed and can be operated in such a way that, in the event of a limiting frequency (fmin) being undershot, the multiplexer (MUX) is caused to switch the first clock signal (clk1) to the clock signal output (1.2-1.5).

Abstract: A circuit arrangement can have a number of integrated circuit components, which are arranged on a carrier substrate. A reception circuit for receiving a control signal can be coupled to one of the connection pads on the input side and can be connected to each of the circuit components on the output side. A bridging circuit controlled by a test mode signal can electrically bridge the reception circuit. In a testing method, a plurality of connection pads can be connected to a first potential and at least one of the connection pads can be connected to a second potential. The bridging circuit can be activated and the current measured, by a test arrangement, at the at least one of the connection pads. Inspection for leakage currents in connections between input-side reception circuits and the circuit components can be measured.

Abstract: The invention relates to a vacuum cleaner with a suction tube nozzle unit, consisting of suction hose, handle, suction tube and suction nozzle, the suction nozzle unit being releasably connected to the vacuum cleaner housing by a coupling device.

Abstract: An electrical vacuum cleaner, including a vacuum cleaner housing, a suction tube nozzle unit, a suction hose, a suction tube and a suction nozzle, and a retaining arrangement for the suction tube nozzle unit which is provided on the vacuum cleaner housing, the retaining arrangement including a pivotable retaining clip for the suction tube and a retaining recess for a hook mounted on at least one of the suction tube and the suction nozzle, a spring arm movably mounted on an inner wall of the vacuum cleaner housing, the spring arm being hinged, at one end, to the retaining clip, its other end being operatively connectable to the hook in the region of the retaining recess, and a resiliently deformable holder mounted on the spring arm substantially at right angles to a direction of movement, the spring arm and the holder having a recoil force which is less than a force exerted by the hook on the spring arm.