Abstract: This invention relates to input channel diagnostics for an industrial process control system. The invention provides improved apparatus and methods relating to fault containment, overload protection and input channel diagnostics.

Abstract: This invention relates to input channel diagnostics for an industrial process control system. The invention provides improved apparatus and methods relating to fault containment, overload protection and input channel diagnostics.

Abstract: Input channel diagnostics for an industrial process control system that provides improved apparatus and methods relating to fault containment, overload protection and input channel diagnostics. The input circuit includes one or more series resistors that have a total resistance that is at least two orders of magnitude greater than the magnitude of the resistance of a conditioned sensor signal source.

Abstract: A method and system for testing and protecting the operability of an output module. An output channel includes a transistor having a gate, a source, and a drain. The output channel drives a load with a load voltage and a load current in dependence upon a gate drive signal applied to the gate. The system determines a voltage threshold and a current threshold and monotonically varies the gate drive signal from a starting value for a predetermined time interval while monitoring the load current and the load voltage. The system returns the gate drive signal to the starting value if any of the load voltage reaches the voltage threshold, the load current reaches the current threshold, or a predetermined time interval expires indicating the condition of the output module.

Abstract: An industrial process control apparatus and method that includes a number of processors and a number of input/output modules. Each processor is connected to a plurality of the input/output modules by a unidirectional command line. Each input/output module is connected to a plurality of the processors by a unidirectional response line. The processors are arranged to issue an identifier request to all of the connected input/output modules and each input/output module is arranged to respond to the identifier request via the respective response line with a response that includes a unique identifier. Such a configuration allows each processor to identify the physical location of each respective input/output module.

Abstract: A method and system for testing and protecting the operability of an output module. An output channel includes a transistor having a gate, a source, and a drain. The output channel drives a load with a load voltage and a load current in dependence upon a gate drive signal applied to the gate. The system determines a voltage threshold and a current threshold and monotonically varies the gate drive signal from a starting value for a predetermined time interval while monitoring the load current and the load voltage. The system returns the gate drive signal to the starting value if any of the load voltage reaches the voltage threshold, the load current reaches the current threshold, or a predetermined time interval expires indicating the condition of the output module.

Abstract: An industrial process control apparatus and method that includes a number of processors and a number of input/output modules. Each processor is connected to a plurality of the input/output modules by a unidirectional command line. Each input/output module is connected to a plurality of the processors by a unidirectional response line. The processors are arranged to issue an identifier request to all of the connected input/output modules and each input/output module is arranged to respond to the identifier request via the respective response line with a response that includes a unique identifier. Such a configuration allows each processor to identify the physical location of each respective input/output module.

Abstract: This invention relates to input channel diagnostics for an industrial process control system. The invention provides improved apparatus and methods relating to fault containment, overload protection and input channel diagnostics.