Patents by Inventor Gerard Blaney

Gerard Blaney has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for testing multiple integrated circuit devices on a film frame handler
    Patent number: 8497697
    Abstract: Film frame assemblies and apparatus for testing and singulating integrated circuit packages, as well as associated methods for forming a film frame assembly, and testing and singulating integrated circuit packages are disclosed. A plurality of leads on a lead frame are cut to form singulated integrated circuit packages. Apparatus and methods are disclosed for mechanically aligning a set of electrical contacts attached to a contactor body with a plurality of leads on a singulated integrated circuit package.
    Type: Grant
    Filed: June 14, 2010
    Date of Patent: July 30, 2013
    Assignee: Analog Devices, Inc.
    Inventor: Gerard Blaney
  • Apparatus for testing infrared sensors
    Patent number: 8147129
    Abstract: An apparatus for use with automatic testing equipment for testing infrared sensors on integrated circuits is provided. The apparatus includes an infrared source, a heat mass, and an electronic frequency modulator. The infrared source is modulated according to a predetermined test frequency such that the infrared source emits an infrared test signal representative of a test temperature and corresponding to the temperature of the heat mass and the predetermined test frequency. A signal processor, electrically coupled to an integrated circuit having an infrared sensor, receives a sensed signal from the infrared sensor in response to the infrared test signal and uses the sensed signal according to the predetermined test frequency to determine a measured temperature.
    Type: Grant
    Filed: April 8, 2009
    Date of Patent: April 3, 2012
    Assignee: Analog Devices, Inc.
    Inventors: John Grubb, Gerard Blaney, Eamon Culhane
  • APPARATUS AND METHOD FOR TESTING MULTIPLE INTEGRATED CIRCUIT DEVICES ON A FILM FRAME HANDLER
    Publication number: 20110306166
    Abstract: Film frame assemblies and apparatus for testing and singulating integrated circuit packages, as well as associated methods for forming a film frame assembly, and testing and singulating integrated circuit packages are disclosed. A plurality of leads on a lead frame are cut to form singulated integrated circuit packages. Apparatus and methods are disclosed for mechanically aligning a set of electrical contacts attached to a contactor body with a plurality of leads on a singulated integrated circuit package.
    Type: Application
    Filed: June 14, 2010
    Publication date: December 15, 2011
    Applicant: Analog Devices, Inc.
    Inventor: Gerard Blaney
  • Apparatus for Testing Infrared Sensors
    Publication number: 20100260229
    Abstract: An apparatus for use with automatic testing equipment for testing infrared sensors on integrated circuits is provided. The apparatus includes an infrared source, a heat mass, and an electronic frequency modulator. The infrared source is modulated according to a predetermined test frequency such that the infrared source emits an infrared test signal representative of a test temperature and corresponding to the temperature of the heat mass and the predetermined test frequency. A signal processor, electrically coupled to an integrated circuit having an infrared sensor, receives a sensed signal from the infrared sensor in response to the infrared test signal and uses the sensed signal according to the predetermined test frequency to determine a measured temperature.
    Type: Application
    Filed: April 8, 2009
    Publication date: October 14, 2010
    Applicant: Analog Devices, Inc.
    Inventors: John Grubb, Gerard Blaney, Eamon Culhane
  • Device under test pogo pin type contact element
    Patent number: 7728613
    Abstract: A device under test pogo pin type contactor features an active head and an electronic component associated with the active head. A tip is spaced from the active head and a biasing device is between the active head and the tip for biasing the active head against a device under test.
    Type: Grant
    Filed: October 17, 2007
    Date of Patent: June 1, 2010
    Assignee: Analog Devices, Inc.
    Inventors: Gerard Blaney, John Grubb, Niall Nolan
  • Testing system contactor
    Patent number: 7683649
    Abstract: A testing system contactor with an integral temperature measurement sensor.
    Type: Grant
    Filed: October 17, 2007
    Date of Patent: March 23, 2010
    Assignee: Analog Devices, Inc.
    Inventors: Gerard Blaney, John Grubb, Niall Nolan
  • Device under test pogo pin type contact element
    Publication number: 20080116924
    Abstract: A device under test pogo pin type contactor features an active head and an electronic component associated with the active head. A tip is spaced from the active head and a biasing device is between the active head and the tip for biasing the active head against a device under test.
    Type: Application
    Filed: October 17, 2007
    Publication date: May 22, 2008
    Inventors: Gerard Blaney, John Grubb, Niall Nolan
  • Testing system contactor
    Publication number: 20080116922
    Abstract: A testing system contactor with an integral temperature measurement sensor.
    Type: Application
    Filed: October 17, 2007
    Publication date: May 22, 2008
    Inventors: Gerard Blaney, John Grubb, Niall Nolan