Patents by Inventor Gerard Laugler

Gerard Laugler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multiple contact vertical probe solution enabling kelvin connection benefits for conductive bump probing
    Publication number: 20030141883
    Abstract: Apparatus and methods for testing conductive bumps or target test points on integrated circuits comprising a multiplicity of probes extending through a support substrate. At least one of the multiplicity of probe locations including a second electrically isolated probe such that the test point is in contact with two probes. One of the two probes providing a voltage to the test point and the second probe sensing the voltage so as to provide a Kelvin connection.
    Type: Application
    Filed: January 25, 2002
    Publication date: July 31, 2003
    Inventors: Scott W. Mitchell, Reynaldo M. Rincon, Jerry Broz, Gerard Laugler