Abstract: To provide fast mask defect scoring, approximated wafer simulations (e.g. using one convolution) are performed on the defect inspection image and its corresponding reference inspection image. Using the approximated defect wafer image and the approximated reference wafer image generated by these approximated wafer simulations, a defect maximum intensity difference (MID) is computed by subtracting one approximated wafer image from the other approximated wafer image to generate a difference image. After a defect region of the difference image is clearly defined, a simulation at the centroid (i.e. a single point) of the defect region is performed. After the defect MID is computed (represented by an intensity) it can be compared to a prototype MID, which can represent a generic nuisance defect.

Abstract: To provide fast mask defect scoring, approximated wafer simulations (e.g. using one convolution) are performed on the defect inspection image and its corresponding reference inspection image. Using the approximated defect wafer image and the approximated reference wafer image generated by these approximated wafer simulations, a defect maximum intensity difference (MID) is computed by subtracting one approximated wafer image from the other approximated wafer image to generate a difference image. After a defect region of the difference image is clearly defined, a simulation at the centroid (i.e. a single point) of the defect region is performed. After the defect MID is computed (represented by an intensity) it can be compared to a prototype MID, which can represent a generic nuisance defect.

Abstract: The present invention provides methods and systems for improving the performance of a pair of non discrete multi-tone based digital subscriber line modems by choosing transmitted power spectral densities according to line conditions. The G.SHDSL and HDSL2 standards, for example, may specify the transmitted power to be less than a certain value at any given frequency. The present invention provides a method and system for shaping power spectral density based on line conditions where first line condition data associated with a first modem is determined; second line condition data associated with a second modem is determined; the first and second line condition data are exchanged, and a transmit spectrum is shaped in response thereto.

Abstract: Flyback imaging is combined with echo planar imaging (EPI) for improved readout flow properties. For increases in imaging time of 50% or less, significant improvements in imaging are realized. The partial flyback improves partial-Fourier EPI and inside-out EPI and can be applied to any EPI trajectory.