Patents by Inventor Gerardo Orozco Valdes
Gerardo Orozco Valdes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11901636Abstract: Methods, apparatuses, and systems for verifying alignment of a compact antenna test range (CATR) are presented. A radio frequency (RF) profile may be generated based on test signals received by a reference antenna at a plurality of orientations. Phase and amplitude data of the RF profile may be used to determine whether the CATR is aligned properly.Type: GrantFiled: November 4, 2020Date of Patent: February 13, 2024Assignee: National Instruments CorporationInventors: Gerardo Orozco Valdes, Dong Chen
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Publication number: 20220140497Abstract: Methods, apparatuses, and systems for verifying alignment of a compact antenna test range (CATR) are presented. A radio frequency (RF) profile may be generated based on test signals received by a reference antenna at a plurality of orientations. Phase and amplitude data of the RF profile may be used to determine whether the CATR is aligned properly.Type: ApplicationFiled: November 4, 2020Publication date: May 5, 2022Inventors: Gerardo Orozco Valdes, Dong Chen
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Publication number: 20220082601Abstract: Various embodiments are presented of a system including an alignment fixture for testing (e.g., rapidly and cheaply) phased array antennas and other devices configured for radio frequency (RF) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be positioned in a testing position by the alignment fixture. The alignment fixture may provide a configurable level of friction to retain the DUT in the testing position. The alignment fixture may provide isolation from electromagnetic interference for the DUT while in the testing position.Type: ApplicationFiled: October 7, 2020Publication date: March 17, 2022Inventors: David M. Crowley, Gerardo Orozco Valdes, Chen Chang
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Patent number: 11255891Abstract: Various embodiments are presented of a system including an alignment fixture for testing (e.g., rapidly and cheaply) phased array antennas and other devices configured for radio frequency (RF) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be positioned in a testing position by the alignment fixture. The alignment fixture may provide a configurable level of friction to retain the DUT in the testing position. The alignment fixture may provide isolation from electromagnetic interference for the DUT while in the testing position.Type: GrantFiled: October 7, 2020Date of Patent: February 22, 2022Assignee: National Instruments CorporationInventors: David M. Crowley, Gerardo Orozco Valdes, Chen Chang
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Patent number: 10942214Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.Type: GrantFiled: September 25, 2018Date of Patent: March 9, 2021Assignee: National Instruments CorporationInventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz
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Patent number: 10725080Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.Type: GrantFiled: September 25, 2018Date of Patent: July 28, 2020Assignee: National Instruments CorporationInventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz
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Publication number: 20200096547Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.Type: ApplicationFiled: September 25, 2018Publication date: March 26, 2020Inventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz
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Publication number: 20200096554Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.Type: ApplicationFiled: September 25, 2018Publication date: March 26, 2020Inventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz
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Patent number: 9332450Abstract: Method and system for a test process. The method may include performing tests on one or more units under test (UUTs). At least one test on one or more UUTs may be performed. A signal may be acquired from the UUT. A reference signal may be retrieved. The reference signal may be derived from a transmitted signal characteristic of the UUT. The signal may be analyzed with respect to the reference signal. Results, useable to characterize the one or more UUTs, from performing the at least one test on the one or more UUTs may be stored. The reference signal may be derived from an initial test and may be stored for subsequent retrieval. A respective reference signal may be retrieved for all UUTs of the one or more UUTs for a respective test. The signal may be a radio frequency signal. The UUT may be a wireless mobile device.Type: GrantFiled: February 25, 2015Date of Patent: May 3, 2016Assignee: National Instruments CorporationInventors: Craig E. Rupp, Gerardo Orozco Valdes, I. Zakir Ahmed, Vijaya Yajnanarayana
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Publication number: 20150172943Abstract: Method and system for a test process. The method may include performing tests on one or more units under test (UUTs). At least one test on one or more UUTs may be performed. A signal may be acquired from the UUT. A reference signal may be retrieved. The reference signal may be derived from a transmitted signal characteristic of the UUT. The signal may be analyzed with respect to the reference signal. Results, useable to characterize the one or more UUTs, from performing the at least one test on the one or more UUTs may be stored. The reference signal may be derived from an initial test and may be stored for subsequent retrieval. A respective reference signal may be retrieved for all UUTs of the one or more UUTs for a respective test. The signal may be a radio frequency signal. The UUT may be a wireless mobile device.Type: ApplicationFiled: February 25, 2015Publication date: June 18, 2015Inventors: Craig E. Rupp, Gerardo Orozco Valdes, I. Zakir Ahmed, Vijaya Yajnanarayana
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Patent number: 8984342Abstract: Method and system for a test process. The method may include performing tests on one or more units under test (UUTs). At least one test on one or more UUTs may be performed. A signal may be acquired from the UUT. A reference signal may be retrieved. The reference signal may be derived from a transmitted signal characteristic of the UUT. The signal may be analyzed with respect to the reference signal. Results, useable to characterize the one or more UUTs, from performing the at least one test on the one or more UUTs may be stored. The reference signal may be derived from an initial test and may be stored for subsequent retrieval. A respective reference signal may be retrieved for all UUTs of the one or more UUTs for a respective test. The signal may be a radio frequency signal. The UUT may be a wireless mobile device.Type: GrantFiled: August 6, 2012Date of Patent: March 17, 2015Assignee: National Instruments CorporationInventors: Craig E. Rupp, Gerardo Orozco Valdes, I. Zakir Ahmed, Vijaya Yajnanarayana
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Publication number: 20140039826Abstract: System and method for testing units under test (UUTs). A test sequence is provided that includes an acquisition sequence and a processing sequence. The acquisition sequence may include a sequence of acquisition functions for performing acquisitions on one or more UUTs. The processing sequence may include a sequence of processing functions for processing measurement data resulting from the acquisitions. Each acquisition function may be performed, including performing a plurality of acquisitions, thereby generating respective measurement data sets, and storing the respective measurement data sets in order of the acquisitions. Each processing function may be performed, including retrieving and processing each respective measurement data set in order of acquisition. At least one processing function of the processing sequence may be performed concurrently with at least one acquisition function of the acquisition sequence.Type: ApplicationFiled: August 3, 2012Publication date: February 6, 2014Inventors: Gerardo Orozco Valdes, Michael J. Lyons, Norman J. Kirchner, JR., Craig E. Rupp
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Publication number: 20140040668Abstract: Method and system for a test process. The method may include performing tests on one or more units under test (UUTs). At least one test on one or more UUTs may be performed. A signal may be acquired from the UUT. A reference signal may be retrieved. The reference signal may be derived from a transmitted signal characteristic of the UUT. The signal may be analyzed with respect to the reference signal. Results, useable to characterize the one or more UUTs, from performing the at least one test on the one or more UUTs may be stored. The reference signal may be derived from an initial test and may be stored for subsequent retrieval. A respective reference signal may be retrieved for all UUTs of the one or more UUTs for a respective test. The signal may be a radio frequency signal. The UUT may be a wireless mobile device.Type: ApplicationFiled: August 6, 2012Publication date: February 6, 2014Inventors: Craig E. Rupp, Gerardo Orozco Valdes, I. Zakir Ahmed, Vijaya Yajnanarayana
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Patent number: 8605774Abstract: A system and method for estimating a time delay introduced by an envelope tracking amplifier (ETA) of a transmitter. The ETA receives a first baseband signal that is generated by the transmitter and operates on the first baseband signal to produce an output signal. The receiver receives a second baseband signal in response to the transmitter's transmission of the output signal. The receiver generates a model signal that represents an estimate of the first baseband signal. The receiver computes a first time delay between the amplitude envelopes of the second baseband signal and the model signal. The receiver computes a second time delay between phase signals derived respectively from the second baseband signal and the model signal. The receiver estimates the time delay that is introduced by the ETA of the transmitter by subtracting the second time delay from the first time delay.Type: GrantFiled: March 25, 2011Date of Patent: December 10, 2013Assignee: National Instruments CorporationInventors: Craig E. Rupp, Gerardo Orozco Valdes, Abram H. Rose, IV
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Publication number: 20120243592Abstract: A system and method for estimating a time delay introduced by an envelope tracking amplifier (ETA) of a transmitter. The ETA receives a first baseband signal that is generated by the transmitter and operates on the first baseband signal to produce an output signal. The receiver receives a second baseband signal in response to the transmitter's transmission of the output signal. The receiver generates a model signal that represents an estimate of the first baseband signal. The receiver computes a first time delay between the amplitude envelopes of the second baseband signal and the model signal. The receiver computes a second time delay between phase signals derived respectively from the second baseband signal and the model signal. The receiver estimates the time delay that is introduced by the ETA of the transmitter by subtracting the second time delay from the first time delay.Type: ApplicationFiled: March 25, 2011Publication date: September 27, 2012Inventors: Craig E. Rupp, Gerardo Orozco Valdes, Abram H. Rose, IV