Patents by Inventor Gerardo Orozco Valdes

Gerardo Orozco Valdes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11901636
    Abstract: Methods, apparatuses, and systems for verifying alignment of a compact antenna test range (CATR) are presented. A radio frequency (RF) profile may be generated based on test signals received by a reference antenna at a plurality of orientations. Phase and amplitude data of the RF profile may be used to determine whether the CATR is aligned properly.
    Type: Grant
    Filed: November 4, 2020
    Date of Patent: February 13, 2024
    Assignee: National Instruments Corporation
    Inventors: Gerardo Orozco Valdes, Dong Chen
  • Publication number: 20220140497
    Abstract: Methods, apparatuses, and systems for verifying alignment of a compact antenna test range (CATR) are presented. A radio frequency (RF) profile may be generated based on test signals received by a reference antenna at a plurality of orientations. Phase and amplitude data of the RF profile may be used to determine whether the CATR is aligned properly.
    Type: Application
    Filed: November 4, 2020
    Publication date: May 5, 2022
    Inventors: Gerardo Orozco Valdes, Dong Chen
  • Publication number: 20220082601
    Abstract: Various embodiments are presented of a system including an alignment fixture for testing (e.g., rapidly and cheaply) phased array antennas and other devices configured for radio frequency (RF) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be positioned in a testing position by the alignment fixture. The alignment fixture may provide a configurable level of friction to retain the DUT in the testing position. The alignment fixture may provide isolation from electromagnetic interference for the DUT while in the testing position.
    Type: Application
    Filed: October 7, 2020
    Publication date: March 17, 2022
    Inventors: David M. Crowley, Gerardo Orozco Valdes, Chen Chang
  • Patent number: 11255891
    Abstract: Various embodiments are presented of a system including an alignment fixture for testing (e.g., rapidly and cheaply) phased array antennas and other devices configured for radio frequency (RF) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be positioned in a testing position by the alignment fixture. The alignment fixture may provide a configurable level of friction to retain the DUT in the testing position. The alignment fixture may provide isolation from electromagnetic interference for the DUT while in the testing position.
    Type: Grant
    Filed: October 7, 2020
    Date of Patent: February 22, 2022
    Assignee: National Instruments Corporation
    Inventors: David M. Crowley, Gerardo Orozco Valdes, Chen Chang
  • Patent number: 10942214
    Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
    Type: Grant
    Filed: September 25, 2018
    Date of Patent: March 9, 2021
    Assignee: National Instruments Corporation
    Inventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz
  • Patent number: 10725080
    Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
    Type: Grant
    Filed: September 25, 2018
    Date of Patent: July 28, 2020
    Assignee: National Instruments Corporation
    Inventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz
  • Publication number: 20200096547
    Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
    Type: Application
    Filed: September 25, 2018
    Publication date: March 26, 2020
    Inventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz
  • Publication number: 20200096554
    Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
    Type: Application
    Filed: September 25, 2018
    Publication date: March 26, 2020
    Inventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz
  • Patent number: 9332450
    Abstract: Method and system for a test process. The method may include performing tests on one or more units under test (UUTs). At least one test on one or more UUTs may be performed. A signal may be acquired from the UUT. A reference signal may be retrieved. The reference signal may be derived from a transmitted signal characteristic of the UUT. The signal may be analyzed with respect to the reference signal. Results, useable to characterize the one or more UUTs, from performing the at least one test on the one or more UUTs may be stored. The reference signal may be derived from an initial test and may be stored for subsequent retrieval. A respective reference signal may be retrieved for all UUTs of the one or more UUTs for a respective test. The signal may be a radio frequency signal. The UUT may be a wireless mobile device.
    Type: Grant
    Filed: February 25, 2015
    Date of Patent: May 3, 2016
    Assignee: National Instruments Corporation
    Inventors: Craig E. Rupp, Gerardo Orozco Valdes, I. Zakir Ahmed, Vijaya Yajnanarayana
  • Publication number: 20150172943
    Abstract: Method and system for a test process. The method may include performing tests on one or more units under test (UUTs). At least one test on one or more UUTs may be performed. A signal may be acquired from the UUT. A reference signal may be retrieved. The reference signal may be derived from a transmitted signal characteristic of the UUT. The signal may be analyzed with respect to the reference signal. Results, useable to characterize the one or more UUTs, from performing the at least one test on the one or more UUTs may be stored. The reference signal may be derived from an initial test and may be stored for subsequent retrieval. A respective reference signal may be retrieved for all UUTs of the one or more UUTs for a respective test. The signal may be a radio frequency signal. The UUT may be a wireless mobile device.
    Type: Application
    Filed: February 25, 2015
    Publication date: June 18, 2015
    Inventors: Craig E. Rupp, Gerardo Orozco Valdes, I. Zakir Ahmed, Vijaya Yajnanarayana
  • Patent number: 8984342
    Abstract: Method and system for a test process. The method may include performing tests on one or more units under test (UUTs). At least one test on one or more UUTs may be performed. A signal may be acquired from the UUT. A reference signal may be retrieved. The reference signal may be derived from a transmitted signal characteristic of the UUT. The signal may be analyzed with respect to the reference signal. Results, useable to characterize the one or more UUTs, from performing the at least one test on the one or more UUTs may be stored. The reference signal may be derived from an initial test and may be stored for subsequent retrieval. A respective reference signal may be retrieved for all UUTs of the one or more UUTs for a respective test. The signal may be a radio frequency signal. The UUT may be a wireless mobile device.
    Type: Grant
    Filed: August 6, 2012
    Date of Patent: March 17, 2015
    Assignee: National Instruments Corporation
    Inventors: Craig E. Rupp, Gerardo Orozco Valdes, I. Zakir Ahmed, Vijaya Yajnanarayana
  • Publication number: 20140039826
    Abstract: System and method for testing units under test (UUTs). A test sequence is provided that includes an acquisition sequence and a processing sequence. The acquisition sequence may include a sequence of acquisition functions for performing acquisitions on one or more UUTs. The processing sequence may include a sequence of processing functions for processing measurement data resulting from the acquisitions. Each acquisition function may be performed, including performing a plurality of acquisitions, thereby generating respective measurement data sets, and storing the respective measurement data sets in order of the acquisitions. Each processing function may be performed, including retrieving and processing each respective measurement data set in order of acquisition. At least one processing function of the processing sequence may be performed concurrently with at least one acquisition function of the acquisition sequence.
    Type: Application
    Filed: August 3, 2012
    Publication date: February 6, 2014
    Inventors: Gerardo Orozco Valdes, Michael J. Lyons, Norman J. Kirchner, JR., Craig E. Rupp
  • Publication number: 20140040668
    Abstract: Method and system for a test process. The method may include performing tests on one or more units under test (UUTs). At least one test on one or more UUTs may be performed. A signal may be acquired from the UUT. A reference signal may be retrieved. The reference signal may be derived from a transmitted signal characteristic of the UUT. The signal may be analyzed with respect to the reference signal. Results, useable to characterize the one or more UUTs, from performing the at least one test on the one or more UUTs may be stored. The reference signal may be derived from an initial test and may be stored for subsequent retrieval. A respective reference signal may be retrieved for all UUTs of the one or more UUTs for a respective test. The signal may be a radio frequency signal. The UUT may be a wireless mobile device.
    Type: Application
    Filed: August 6, 2012
    Publication date: February 6, 2014
    Inventors: Craig E. Rupp, Gerardo Orozco Valdes, I. Zakir Ahmed, Vijaya Yajnanarayana
  • Patent number: 8605774
    Abstract: A system and method for estimating a time delay introduced by an envelope tracking amplifier (ETA) of a transmitter. The ETA receives a first baseband signal that is generated by the transmitter and operates on the first baseband signal to produce an output signal. The receiver receives a second baseband signal in response to the transmitter's transmission of the output signal. The receiver generates a model signal that represents an estimate of the first baseband signal. The receiver computes a first time delay between the amplitude envelopes of the second baseband signal and the model signal. The receiver computes a second time delay between phase signals derived respectively from the second baseband signal and the model signal. The receiver estimates the time delay that is introduced by the ETA of the transmitter by subtracting the second time delay from the first time delay.
    Type: Grant
    Filed: March 25, 2011
    Date of Patent: December 10, 2013
    Assignee: National Instruments Corporation
    Inventors: Craig E. Rupp, Gerardo Orozco Valdes, Abram H. Rose, IV
  • Publication number: 20120243592
    Abstract: A system and method for estimating a time delay introduced by an envelope tracking amplifier (ETA) of a transmitter. The ETA receives a first baseband signal that is generated by the transmitter and operates on the first baseband signal to produce an output signal. The receiver receives a second baseband signal in response to the transmitter's transmission of the output signal. The receiver generates a model signal that represents an estimate of the first baseband signal. The receiver computes a first time delay between the amplitude envelopes of the second baseband signal and the model signal. The receiver computes a second time delay between phase signals derived respectively from the second baseband signal and the model signal. The receiver estimates the time delay that is introduced by the ETA of the transmitter by subtracting the second time delay from the first time delay.
    Type: Application
    Filed: March 25, 2011
    Publication date: September 27, 2012
    Inventors: Craig E. Rupp, Gerardo Orozco Valdes, Abram H. Rose, IV