Abstract: A measuring system for measuring signals with multiple measurement probes includes a multi probe measurement device having at least two probe interfaces that each couple the multi probe measurement device with at least one of the measurement probes, a data interface that couples the multi probe measurement device to a measurement data receiver, and a processing unit coupled to the at least two probe interfaces that records measurement values via the at least two probe interfaces from the measurement probes. The processing unit is further coupled to the data interface and provides the recorded measurement values to the measurement data receiver that also includes a data interface. The data interface of the measurement data receiver is coupled to the data interface of the multi probe measurement device.

Abstract: Method, system and probe for visualizing measured values of an electromagnetic parameter of a PCB. A probe head of a probe contactless measures values of at least one electromagnetic parameter at at least two different positions of the PCB, a camera fixed in position relative to the probe head records for each of the different positions an image of an area of the PCB around the probe head, for each of the different positions, the measured value of the electromagnetic parameter is correlated with the recorded image of the area of the PCB around the probe head, a location of each of the recorded images of the areas on a map representation of the PCB is determined, the map representation of the PCB with the measured values of the electromagnetic parameter, and the map representation of the PCB is visualized together with the superimposed measured values of the electromagnetic parameter.

Abstract: Measurement apparatus and method for digital data acquisition. A first operation mode is provided for real-time processing of digital data having a reduced sample rate or resolution. Furthermore, a second operation mode is provided for processing the measurement signal off-line with a higher accuracy. In particular, the high accuracy data may be temporarily stored and analyzed upon the operation mode is changed from the real-time mode to the off-line mode.

Abstract: A measuring system for measuring signals with multiple measurement probes comprises a multi probe measurement device comprising at least two probe interfaces that each couple the multi probe measurement device with at least one of the measurement probes, a data interface that couples the multi probe measurement device to a measurement data receiver, and a processing unit coupled to the at least two probe interfaces that records measurement, values via the at least two probe interfaces from the measurement probes, wherein the processing unit is further coupled to the data interface and provides the recorded measurement values to the measurement data receiver, and a measurement data receiver comprising a data interface, wherein the data interface of the measurement data receiver is coupled to the data interface of the multi probe measurement device.

Abstract: A measuring system for measuring signals with multiple measurement probes comprises a multi probe measurement device comprising at least two probe interfaces that each couple the multi probe measurement device with at least one of the measurement probes, a data interface that couples the multi probe measurement device to a measurement data receiver, and a processing unit coupled to the at least two probe interfaces that records measurement values via the at least two probe interfaces from the measurement probes, wherein the processing unit is further coupled to the data interface and provides the recorded measurement values to the measurement data receiver, and a measurement data receiver comprising a data interface, wherein the data interface of the measurement data receiver is coupled to the data interface of the multi probe measurement device.

Abstract: A measuring system for measuring signals with multiple measurement probes comprises a multi probe measurement device comprising at least two probe interfaces that each couple the multi probe measurement device with at least one of the measurement probes, a data interface that couples the multi probe measurement device to a measurement data receiver, and a processing unit coupled to the at least two probe interfaces that records measurement values via the at least two probe interfaces from the measurement probes, wherein the processing unit is further coupled to the data interface and provides the recorded measurement values to the measurement data receiver, and a measurement data receiver comprising a data interface, wherein the data interface of the measurement data receiver is coupled to the data interface of the multi probe measurement device.

Abstract: A measuring system for measuring signals with multiple measurement probes comprises a multi probe measurement device comprising at least two probe interfaces that each couple the multi probe measurement device with at least one of the measurement probes, a data interface that couples the multi probe measurement device to a measurement data receiver, and a processing unit coupled to the at least two probe interfaces that records measurement values via the at least two probe interfaces from the measurement probes, wherein the processing unit is further coupled to the data interface and provides the recorded measurement values to the measurement data receiver, and a measurement data receiver comprising a data interface, wherein the data interface of the measurement data receiver is coupled to the data interface of the multi probe measurement device.

Abstract: The invention is related to a method and a measurement device for performing multidimensional signal analysis. The measurement device comprises at least one input terminal configured to apply a signal for a signal analysis. A displaying unit is configured to display the applied signal. A masking unit is configured to define a signal mask, wherein at least one signal mask parameter of the signal mask dynamically varies over the signal analysis time of the applied signal.

Abstract: Measurement apparatus and method for digital data acquisition. A first operation mode is provided for real-time processing of digital data having a reduced sample rate or resolution. Furthermore, a second operation mode is provided for processing the measurement signal off-line with a higher accuracy. In particular, the high accuracy data may be temporarily stored and analyzed upon the operation mode is changed from the real-time mode to the off-line mode.

Abstract: A measuring system for measuring signals with multiple measurement probes comprises a multi probe measurement device comprising at least two probe interfaces that each couple the multi probe measurement device with at least one of the measurement probes, a data interface that couples the multi probe measurement device to a measurement data receiver, and a processing unit coupled to the at least two probe interfaces that records measurement values via the at least two probe interfaces from the measurement probes, wherein the processing unit is further coupled to the data interface and provides the recorded measurement values to the measurement data receiver, and a measurement data receiver comprising a data interface, wherein the data interface of the measurement data receiver is coupled to the data interface of the multi probe measurement device.

Abstract: The invention is related to a measuring device and a method for visually presenting a signal parameter in a displayed signal that comprises the following steps: measuring the signal with a measuring device; buffering the measured signal in a buffer of the measuring device; displaying the buffered signal on a display of the measuring device; determining a signal parameter of the buffered signal in at least two separate signal regions of the buffered signal; and directly displaying the determined signal parameter in the displayed signal at the corresponding signal region.

Abstract: A measuring system for measuring signals with multiple measurement probes comprises a multi probe measurement device comprising at least two probe interfaces that each couple the multi probe measurement device with at least one of the measurement probes, a data interface that couples the multi probe measurement device to a measurement data receiver, and a processing unit coupled to the at least two probe interfaces that records measurement values via the at least two probe interfaces from the measurement probes, wherein the processing unit is further coupled to the data interface and provides the recorded measurement values to the measurement data receiver, and a measurement data receiver comprising a data interface, wherein the data interface of the measurement data receiver is coupled to the data interface of the multi probe measurement device.

Abstract: A measuring system for measuring signals with multiple measurement probes comprises a multi probe measurement device comprising at least two probe interfaces that each couple the multi probe measurement device with at least one of the measurement probes, a data interface that couples the multi probe measurement device to a measurement data receiver, and a processing unit coupled to the at least two probe interfaces that records measurement values via the at least two probe interfaces from the measurement probes, wherein the processing unit is further coupled to the data interface and provides the recorded measurement values to the measurement data receiver, and a measurement data receiver comprising a data interface, wherein the data interface of the measurement data receiver is coupled to the data interface of the multi probe measurement device.

Abstract: The invention is related to a method and a measurement device for performing multidimensional signal analysis. The measurement device comprises at least one input terminal configured to apply a signal for a signal analysis. A displaying unit is configured to display the applied signal. A masking unit is configured to define a signal mask, wherein at least one signal mask parameter of the signal mask dynamically varies over the signal analysis time of the applied signal.

Abstract: The invention is related to a measuring device and a method for visually presenting a signal parameter in a displayed signal that comprises the following steps: measuring the signal with a measuring device; buffering the measured signal in a buffer of the measuring device; displaying the buffered signal on a display of the measuring device; determining a signal parameter of the buffered signal in at least two separate signal regions of the buffered signal; and directly displaying the determined signal parameter in the displayed signal at the corresponding signal region.