Abstract: The invention relates to a method for carrying out measurements on at least one region of interest within a sample via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano-optic deflector for deflecting the laser beam, the method comprising: providing a scanning trajectory for the at least one region of interest; providing a sequence of measurements and the corresponding scanning trajectories; providing cross-over trajectories between the scanning trajectories of two consecutive measurements; deflecting the laser beam via the electro-mechano-optic means for moving a focus spot of the focused laser beam along a scanning trajectory at an average scanning speed; and deflecting the laser beam via the electro-mechano-optic means for moving the focus spot of the laser beam along a cross-over trajectory at a cross-over speed having a maximum, the maximum of the cross-over speed being higher than the average scanning speed.

Abstract: The invention relates to a method for scanning along a continuous scanning trajectory with a scanner system (100) comprising a first pair of acousto-optic deflectors (10) for deflecting a focal spot of an electromagnetic beam generated by a consecutive lens system (200) defining an optical axis (z) in an x-z plane, and a second pair of acousto-optic deflectors (20) for deflecting the focal spot in a y-z plane being substantially perpendicular to the x-z plane, characterised by changing the acoustic frequency sweeps with time continuously in the deflectors (12, 12?) of the first pair of deflectors (10) and in the deflectors (22, 22?) of the second pair of deflectors (20) so as to cause the focal spot to move continuously along the scanning trajectory.

Abstract: The invention relates to a compensator system adapted to compensate for the angular dispersion of electromagnetic beams deflected by at least one acousto-optic deflector of an optical system, wherein the angular dispersion of each deflected beam is dependent on the deflection angle obtained by the deflecting acoustic frequency of the acousto-optic deflector, characterised in that the compensator system comprises: —a first lens group for spatially separating the deflected beams of different deflection angle and angular dispersion by focusing the beams substantially into the focal plane, —a compensator element having a first surface and a second surface, and being arranged such that the first surface of the compensator element lies substantially in the focal plane of the first lens group, and the first and second surfaces of the compensator element have nominal radiuses R1 and R2 that together work as prisms with tilt angles ? and prism opening angles ?p that vary with the distance from the optical axis so as t

Abstract: The invention relates to a method for the 3-dimensional measurement of a sample with a measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by—providing the measuring system with a 3-dimensional virtual reality device,—creating the 3-dimensional virtual space of the measuring space using the 3-dimensional virtual reality device,—allowing for selecting an operation in the virtual space,—providing real-time unidirectional or bidirectional convection between the measuring space and the virtual space such that an operation selected in the virtual space is performed in the measuring space and data measured in the measuring space is displayed in the virtual space.

Abstract: Use of photochemically cleavable compounds in course of one or multi-photon irradiation experiments.

Abstract: A laser scanning reflection or fluorescent microscope is provided with focusing-detecting unit having a laser beam focusing objective, an image detector that detects light reflected from the sample or back fluoresced light emitted by the sample, and a drive that simultaneously displaces the objective and the image detector.

Abstract: A focusing system for focusing an electromagnetic beam for three-dimensional random access applications comprises a first pair of acousto-optic deflectors for focusing an electromagnetic beam in an X-Z plane, and a second pair of acousto-optic deflectors for focusing an electromagnetic beam in a Y-Z plane substantially perpendicular to the X-Z plane. The second pair of acousto-optic deflectors is arranged between the acousto-optic deflectors of the first pair of acousto-optic deflectors such that the first and fourth acousto-optic deflectors of the system belong to the first pair of acousto-optic deflectors and the second and third acousto-optic deflectors of the system belong to the second pair of acousto-optic deflectors.

Abstract: The present invention relates to a focusing system (100) for focusing an electromagnetic beam for three-dimensional random access applications, the system comprising a first pair of acousto-optic deflectors (10) for focusing an electromagnetic beam in an X-Z plane, and a second pair of acousto-optic deflectors (20) for focusing an electromagnetic beam in a Y-Z plane being substantially perpendicular to the X-Z plane, characterised in that the second pair of acousto-optic deflectors (20) are arranged between the acousto-optic deflectors (12, 12?) of the first pair of acousto-optic deflectors (10), such that the first and fourth acousto-optic deflectors (12, 12?) of the system belong to the first pair of acousto-optic deflectors (10) and the second and third acousto-optic deflectors (22, 22?) of the system belong to the second pair of acousto-optic deflectors (20).

Abstract: The invention relates to a method for carrying out measurements on at least one region of interest within a sample via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano-optic deflector for deflecting the laser beam, the method comprising: providing a scanning trajectory for the at least one region of interest; providing a sequence of measurements and the corresponding scanning trajectories; providing cross-over trajectories between the scanning trajectories of two consecutive measurements; deflecting the laser beam via the electro-mechano-optic means for moving a focus spot of the focused laser beam along a scanning trajectory at an average scanning speed; and deflecting the laser beam via the electro-mechano-optic means for moving the focus spot of the laser beam along a cross-over trajectory at a cross-over speed having a maximum, the maximum of the cross-over speed being higher than the average scanning speed.

Abstract: The present invention relates to a laser scanning microscope (10) for scanning a sample, the microscope having focusing means (15) having a focal plane (29) and comprising at least one optical element for focusing a laser beam (13), drive means (18) for displacing the at least one optical element of the focusing means (15), at least one detector means (24?) for detecting light (13?) reflected from the sample or back fluoresced light (13?) emitted by the sample, characterised by the detector means (24?) being connected to the drive means (18) such that the drive means (18) may simultaneously displace the detector means (24?) with the at least one optical element of the focusing means (15). The present invention further relates to a method of performing 3D scanning with the inventive laser scanning microscope.

Abstract: The invention relates to a laser scanning microscope (10) having: focusing means (15) having a focal plane (29) and comprising at least one optical element for focusing a laser beam (13); drive means (18) for displacing the at least one optical element of the focusing means (15) for changing the position of the focal plane (29), and deflecting means (14) for deflecting the laser beam (13). The microscope comprises a control system (32) configured to carry out the steps of: providing a periodical drive signal for the drive means (18); obtaining time dependant displacement data of the at least one optical element of the focusing means (15) in response to the periodical drive signal of the drive means (18); providing a response function (z(t)) using the time dependant displacement data, calculating a drive signal for the deflecting means (14) using the response function (z(t)) to move the focal volume (30) of the laser beam (13) along a given 3D trajectory (48) within a sample to be examined.

Abstract: A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photochemically stimulate pre-selected points within a short time interval. The system further comprises a bundle of fibers composed of optical fibers or other waveguides, a rapidly working optical switch, a imaging system, a light source and an optical system. The examining optical signal is a fluorescent or other optical signal imaged on the required spot.

Abstract: A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photochemically stimulate pre-selected points within a short time interval. The system further comprises a bundle of fibers composed of optical fibers or other waveguides, a rapidly working optical switch, a imaging system, a light source and an optical system. The examining optical signal is a fluorescent or other optical signal imaged on the required spot.