Abstract: The invention provides a cannula insertion system to insert a cannula into a blood vessel of a human or animal body, comprising: ?an ultrasound probe (3) to provide an ultrasound signal to determine a location of a blood vessel (V) in a human or animal body, ?a cannula insertion device (8) configured to insert the cannula (2) into the blood vessel, ?wherein the ultrasound probe comprises a contact surface (3b) to contact a skin (S) of the human or animal body, ?wherein the contact surface comprises one or more protrusions (14, 16) that can be used to stabilize the blood vessel when the contact surface is pressed on the skin.

Abstract: A cannula insertion system to insert a cannula into a human or animal body, includes: one or more sensors to determine a suitable location for insertion of the cannula, a cannula insertion device configured to insert the cannula into the human or animal body, a cannula insertion device positioning system to support and position the cannula insertion device, and a control device arranged to control the positioning system to position, on the basis of the determined location for insertion of the cannula, the cannula insertion device in a suitable position to insert the cannula into human or animal body, where the cannula insertion system includes a blood collection system to collect blood in one or more blood collection tubes supported by the blood collection system, where the blood collection system is movably arranged to at least partly follow movements of the cannula insertion device.

Abstract: A cannula insertion system for inserting a cannula into a human or animal body, includes a cannula and a cannula insertion device to hold and insert the cannula into the human or animal body in an insertion direction. The cannula insertion system includes a safety device configured to retract the cannula or to release the cannula from the cannula insertion device when a force exerted on the cannula in a direction perpendicular to the insertion direction results in exceeding a respective safety threshold value.

Abstract: A cannula insertion system for inserting a cannula into a human or animal body, includes a cannula and a cannula insertion device to hold and insert the cannula into the human or animal body in an insertion direction.

Abstract: A cannula insertion system includes: a contact sensor positioning system arranged to determine a suitable location for insertion of the cannula, where the contact sensor positioning system includes: a contact sensor having a contact surface to be placed at least partially on the human or animal body to enable measurement with the contact sensor, a positioning device configured to support and position the contact sensor, and a control device arranged to control the positioning device to position the contact sensor in a desired position. The contact sensor positioning system includes one or more sensors to determine a position and/or contact force related parameter representative for a position and/or contact force of the contact sensor, and a processing device to process the position and/or contact force related parameter and to provide a position control signal to the control device, where the contact sensor is an imaging sensor.

Abstract: A cannula insertion system for inserting a cannula into a blood vessel of a human or animal includes one or more sensors to provide one or more sensor signals representative for a location of the blood vessel, a processing device to determine a location of the blood vessel on the basis of the one or more sensor signals, a cannula insertion device to insert the cannula into the blood vessel, a positioning system supporting the cannula insertion device, and a control device arranged to control the positioning system to position, on the basis of the determined location of the blood vessel. The one or more sensors include a contact sensor to be placed on a target area of the skin of the human or animal to enable measurement with the contact sensor. The cannula insertion system includes a coupler liquid application device to apply contact liquid to the skin.

Abstract: A medical simulator handpiece (112; 114) has a body (156; 180), a first formation (157; 184) representing a first medical tool and is characterized by a second formation (159, 161; 186) representing a second, different medical tool in which the first and second formations are connected and spaced apart to permit a user to manipulate one or other of the first and second formations.

Abstract: A medical procedure simulator (100) has a computer (102) configured to run medical simulation software to simulate a medical procedure; at least one handpiece (112, 114) configured to be held in the hand of a user and manipulated by the user in a real space, which handpiece comprises an inertial measurement unit (220) for creation of position and/or orientation data of the handpiece in real space; and, a data link (222) to the computer from the handpiece for transmission of the position and/or orientation data.

Abstract: A medical simulator handpiece (112; 114) has a body (156; 180), a first formation (157; 184) representing a first medical tool and is characterised by a second formation (159, 161; 186) representing a second, different medical tool in which the first and second formations are connected and spaced apart to permit a user to manipulate one or other of the first and second formations.

Abstract: An improved method and apparatus for S/TEM sample preparation and analysis. Preferred embodiments of the present invention provide improved methods for TEM sample creation, especially for small geometry (<100 nm thick) TEM lamellae. Preferred embodiments of the present invention also provide an in-line process for S/TEM based metrology on objects such as integrated circuits or other structures fabricated on semiconductor wafer by providing methods to partially or fully automate TEM sample creation, to make the process of creating and analyzing TEM samples less labor intensive, and to increase throughput and reproducibility of TEM analysis.

Abstract: An improved method and apparatus for S/TEM sample preparation and analysis. Preferred embodiments of the present invention provide improved methods for TEM sample creation, especially for small geometry (<100 nm thick) TEM lamellae. Preferred embodiments of the present invention also provide an in-line process for S/TEM based metrology on objects such as integrated circuits or other structures fabricated on semiconductor wafer by providing methods to partially or fully automate TEM sample creation, to make the process of creating and analyzing TEM samples less labor intensive, and to increase throughput and reproducibility of TEM analysis.

Abstract: An improved method and apparatus for extracting and handling samples for S/TEM analysis. Preferred embodiments of the present invention make use of a micromanipulator and a hollow microprobe probe using vacuum pressure to adhere the microprobe tip to the sample. By applying a small vacuum pressure to the lamella through the microprobe tip, the lamella can be held more securely and its placement controlled more accurately than by using electrostatic force alone. By using a probe having a beveled tip and which can also be rotated around its long axis, the extracted sample can be placed down flat on a sample holder. This allows sample placement and orientation to be precisely controlled, thus greatly increasing predictability of analysis and throughput.

Abstract: An improved method and apparatus for S/TEM sample preparation and analysis. Preferred embodiments of the present invention provide improved methods for TEM sample creation, especially for small geometry (<100 nm thick) TEM lamellae. Preferred embodiments of the present invention also provide an in-line process for S/TEM based metrology on objects such as integrated circuits or other structures fabricated on semiconductor wafer by providing methods to partially or fully automate TEM sample creation, to make the process of creating and analyzing TEM samples less labor intensive, and to increase throughput and reproducibility of TEM analysis.

Abstract: An improved method and apparatus for extracting and handling samples for S/TEM analysis. Preferred embodiments of the present invention make use of a micromanipulator and a hollow microprobe probe using vacuum pressure to adhere the microprobe tip to the sample. By applying a small vacuum pressure to the lamella through the microprobe tip, the lamella can be held more securely and its placement controlled more accurately than by using electrostatic force alone. By using a probe having a beveled tip and which can also be rotated around its long axis, the extracted sample can be placed down flat on a sample holder. This allows sample placement and orientation to be precisely controlled, thus greatly increasing predictability of analysis and throughput.

Abstract: An improved method and apparatus for S/TEM sample preparation and analysis. Preferred embodiments of the present invention provide improved methods for TEM sample creation, especially for small geometry (<100 nm thick) TEM lamellae. Preferred embodiments of the present invention also provide an in-line process for S/TEM based metrology on objects such as integrated circuits or other structures fabricated on semiconductor wafer by providing methods to partially or fully automate TEM sample creation, to make the process of creating and analyzing TEM samples less labor intensive, and to increase throughput and reproducibility of TEM analysis.

Abstract: An improved method and apparatus for extracting and handling samples for S/TEM analysis. Preferred embodiments of the present invention make use of a micromanipulator and a hollow microprobe probe using vacuum pressure to adhere the microprobe tip to the sample. By applying a small vacuum pressure to the lamella through the microprobe tip, the lamella can be held more securely and its placement controlled more accurately than by using electrostatic force alone. By using a probe having a beveled tip and which can also be rotated around its long axis, the extracted sample can be placed down flat on a sample holder. This allows sample placement and orientation to be precisely controlled, thus greatly increasing predictability of analysis and throughput.

Abstract: An improved method and apparatus for S/TEM sample preparation and analysis. Preferred embodiments of the present invention provide improved methods for TEM sample creation, especially for small geometry (<100 nm thick) TEM lamellae. Preferred embodiments of the present invention also provide an in-line process for S/TEM based metrology on objects such as integrated circuits or other structures fabricated on semiconductor wafer by providing methods to partially or fully automate TEM sample creation, to make the process of creating and analyzing TEM samples less labor intensive, and to increase throughput and reproducibility of TEM analysis.

Abstract: An improved method and apparatus for S/TEM sample preparation and analysis. Preferred embodiments of the present invention provide improved methods for TEM sample creation, especially for small geometry (<100 nm thick) TEM lamellae. Preferred embodiments of the present invention also provide an in-line process for S/TEM based metrology on objects such as integrated circuits or other structures fabricated on semiconductor wafer by providing methods to partially or fully automate TEM sample creation, to make the process of creating and analyzing TEM samples less labor intensive, and to increase throughput and reproducibility of TEM analysis.

Abstract: An improved method and apparatus for extracting and handling samples for STEM analysis. Preferred embodiments of the present invention make use of a micromanipulator and a hollow microprobe probe using vacuum pressure to adhere the microprobe tip to the sample. By applying a small vacuum pressure to the lamella through the microprobe tip, the lamella can be held more securely and its placement controlled more accurately than by using electrostatic force alone. By using a probe having a beveled tip and which can also be rotated around its long axis, the extracted sample can be placed down flat on a sample holder. This allows sample placement and orientation to be precisely controlled, thus greatly increasing predictability of analysis and throughput.

Abstract: An improved method and apparatus for S/TEM sample preparation and analysis. Preferred embodiments of the present invention provide improved methods for TEM sample creation, especially for small geometry (<100 nm thick) TEM lamellae. Preferred embodiments of the present invention also provide an in-line process for S/TEM based metrology on objects such as integrated circuits or other structures fabricated on semiconductor wafer by providing methods to partially or fully automate TEM sample creation, to make the process of creating and analyzing TEM samples less labor intensive, and to increase throughput and reproducibility of TEM analysis.