Abstract: A method for detecting and controlling compaction when compacting a soil by a depth vibrator which has a rotationally drivable imbalance (3) and at least one sensor (6, 12, 13, 14, 19), comprising the steps of: inserting the depth vibrator (2) into the soil (17) up to a desired final depth (Tm); compaction of the soil (17) during which the forward angle (?) of the imbalance (3) as well as the oscillation amplitude (A) of the depth vibrator (2) are determined; detection of a soil stiffness profile from soil stiffness values (k) determined over time (t); determination of a first soil stiffness value (k1) and a second soil stiffness value (k2) from the soil stiffness profile (k), for which it applies that a rate of increase (k?2) of the second soil stiffness value (k2) exceeds a rate of increase (k?1) of the first soil stiffness value (k1) by a defined factor; calculation of a transition soil stiffness value (k12) which is between the first soil stiffness value (k1) and the second soil stiffness value (k2); a

Abstract: A method for detecting and controlling compaction when compacting a soil by a depth vibrator which has a rotationally drivable imbalance (3) and at least one sensor (6, 12, 13, 14, 19), comprising the steps of: inserting the depth vibrator (2) into the soil (17) up to a desired final depth (Tm); compaction of the the soil (17) during which the forward angle (?) of the imbalance (3) as well as the oscillation amplitude (A) of the depth vibrator (2) are determined; detection of a soil stiffness profile from soil stiffness values (k) determined over time (t); determination of a first soil stiffness value (k1) and a second soil stiffness value (k2) from the soil stiffness profile (k), for which it applies that a rate of increase (k?2) of the second soil stiffness value (k2) exceeds a rate of increase (k?1) of the first soil stiffness value (k1) by a defined factor; calculation of a transition soil stiffness value (k12) which is between the first soil stiffness value (k1) and the second soil stiffness value (k2

Abstract: A reaction chamber apparatus includes a vertically movable heater-susceptor with an attached annular attached flow ring that performs as a gas conduit. The outlet port of the flow ring extends below the bottom of a wafer transport slot valve when the susceptor is in its process (higher) position, while the gas conduit formed by the flow ring has an external surface at its edge that isolates the outer space of the reactor above the wafer from the confined reaction space. In some cases, the outer edge of the gas conduit is in proximity to a ring attached to the reactor lid and, together, the ring and conduit act as a tongue-in-groove (TIG) configuration. In some cases, the TIG design may have a staircase contour, thereby limiting diffusion-backflow of downstream gases to the outer space of the reactor.

Abstract: The invention relates to a device for depositing especially, crystalline layers onto one or more, especially, also crystalline substrates in a process chamber using reaction gases which are guided into said process chamber, where they undergo pyrolytic reaction. The device has a heatable support plate wherein at least one substrate holder lies loosely, especially rotationally, with its surface flush with the surroundings. A compensation plate which adjoins the at least one substrate holder, following the contours of the same, is provided on the support plate in order to keep the isothermal profile on the support plate as flat as possible.

Abstract: The invention relates to a device for removably fixing a mask in the form of a rectangular frame, on the legs of which clamping means are provided for gripping the end of the mask. According to the invention, the clamping means comprise a plurality of individual spring elements which grip closely adjacent points on the mask edge. The individual spring elements which are assigned to one leg of the frame and are embodied as leaf springs that are interconnected in a comb-type manner can be moved from a fitting position in which the frame can be fitted with the mask into a clamping position by means of a common auxiliary clamping member.

Abstract: The invention relates to a method and device for depositing at least one layer, particularly a semiconductor layer, onto at least one substrate (5), which is situated inside a process chamber (2) of a reactor (1) while being supported by a substrate holder (4). The layer is comprised of at least two material components provided in a fixed stoichiometric ratio, which are each introduced into the reactor (1) in the form of a first and a second reaction gas, and a portion of the decomposition products form the layer, whereby the supply of the first reaction gas, which has a low thermal activation energy, determines the growth rate of the layer, and the second reaction gas, which has a high thermal activation energy, is supplied in excess and is preconditioned, in particular, by an independent supply of energy.

Abstract: The invention relates to a method and a device for depositing thin layers on a substrate in a process chamber arranged in a reactor housing, the bottom of said process chamber consisting of a temperable substrate holder which can be rotatably driven about its vertical axis, and the cover of said chamber consisting of a gas inlet element. Said cover extends parallel to the bottom and forms, together with its gas outlets arranged in a sieve-type manner, a gas exit surface which extends over the entire substrate bearing surface of the substrate holder, the process gas being introduced into the process chamber through said gas exit surface. The invention is characterized in that the height of the process chamber which is defined by the distance between the substrate bearing surface and the gas exit surface is varied before the beginning of the deposition process and/or during the deposition process.

Abstract: The invention relates to a device for carrying out a method wherein the process gases are introduced via a common gas inlet element (D) into the process chamber in which a substrate holder (S) is arranged. The gas inlet element has a gas outlet surface which is tempered and which possesses a plurality of gas outlets like a sieve. The substrate holder extends parallel to the gas outlet surface on a horizontal plane and is rotationally driven about a vertical axis. The distance between the substrate holder and the gas outlet surface is not greater than 75 mm. A gas supply device for the reactive gases consisting of at least one metal-organic compound and at least one hydride in addition to another gas is also provided. The isotherms extending above the substrate holder become increasingly flatter as the distance from the gas inlet element becomes smaller, thereby resulting in a higher degree of isothermic homogeneity.

Abstract: The invention relates to a device for depositing thin layers on a substrate, comprising a process chamber arranged in a reactor housing, the bottom of said process chamber being formed by a susceptor for receiving at least one substrate and a gas inlet organ being assigned to the lid of said process chamber, wherein the process gas can be introduced into the process chamber by means of a gas outlet surface which is substantially evenly distributed on the surface thereof and which points towards the susceptor. In order to prevent parasitic accumulation in the gas inlet organ, the gas outlet surface is formed by a gas-permeable diffuser plate, which can extend parallel to a gas outlet plate having a plurality of gas outlet holes arranged in the form of sieves.

Abstract: Embodiments of the present invention are directed to packaged power semiconductor devices and direct-bonded metal substrates thereof. In one embodiment, a method for manufacturing a power semiconductor device comprises inserting a substrate assembly into a furnace having a plurality of process zones. The substrate assembly includes a first aluminum layer and a second aluminum layer that are electrically isolated from each other by a dielectric layer. The method further comprises providing the substrate assembly successively into each of the plurality of process zones to bond the first and second aluminum layers to the dielectric layer and obtain a direct bonded aluminum (DAB) substrate, attaching a semiconductor die to the first aluminum layer of the DAB substrate, and forming an enclosure around the semiconductor die and the DAB substrate while exposing a substantial portion of the second aluminum layer for enhanced heat dissipation.

Abstract: Embodiments of the present invention are directed to packaged power semiconductor devices and direct-bonded metal substrates thereof. In one embodiment, a method for manufacturing a power semiconductor device comprises inserting a substrate assembly into a furnace having a plurality of process zones. The substrate assembly includes a first aluminum layer and a second aluminum layer that are electrically isolated from each other by a dielectric layer. The method further comprises providing the substrate assembly successively into each of the plurality of process zones to bond the first and second aluminum layers to the dielectric layer and obtain a direct bonded aluminum (DAB) substrate, attaching a semiconductor die to the first aluminum layer of the DAB substrate, and forming an enclosure around the semiconductor die and the DAB substrate while exposing a substantial portion of the second aluminum layer for enhanced heat dissipation.

Abstract: Embodiments of the present invention are directed to packaged power semiconductor devices and direct-bonded metal substrates thereof. In one embodiment, a method for manufacturing a power semiconductor device comprises inserting a substrate assembly into a furnace having a plurality of process zones. The substrate assembly includes a first aluminum layer and a second aluminum layer that are electrically isolated from each other by a dielectric layer. The method further comprises providing the substrate assembly successively into each of the plurality of process zones to bond the first and second aluminum layers to the dielectric layer and obtain a direct bonded aluminum (DAB) substrate, attaching a semiconductor die to the first aluminum layer of the DAB substrate, and forming an enclosure around the semiconductor die and the DAB substrate while exposing a substantial portion of the second aluminum layer for enhanced heat dissipation.

Abstract: Embodiments of the present invention are directed to packaged power semiconductor devices and direct-bonded metal substrates thereof. In one embodiment, a method for manufacturing a power semiconductor device comprises inserting a substrate assembly into a furnace having a plurality of process zones. The substrate assembly includes a first aluminum layer and a second aluminum layer that are electrically isolated from each other by a dielectric layer. The method further comprises providing the substrate assembly successively into each of the plurality of process zones to bond the first and second aluminum layers to the dielectric layer and obtain a direct bonded aluminum (DAB) substrate, attaching a semiconductor die to the first aluminum layer of the DAB substrate, and forming an enclosure around the semiconductor die and the DAB substrate while exposing a substantial portion of the second aluminum layer for enhanced heat dissipation.