Abstract: A method and apparatus including an interferometer is provided for sequentially recording interferometric sectional images at different depths, in particular for analyzing an eye. By use of an interferometer, which includes an optical reference path and an optical sample path, a sample beam scans a measuring region of a sample, in particular of an eye, so as to generate a deep sectional image. The optical and geometric paths in a sample arm and/or reference arm of the interferometer can be switched quickly between two or more positions. The path length of the sample beam and/or of the reference beam is changed by way of a path length switching unit, deep sectional images are generated at least at two different depths of the sample, and the change of the path length in the switching unit takes place by deflection of the beam paths to different geometric paths.

Abstract: A method and apparatus including an interferometer is provided for sequentially recording interferometric sectional images at different depths, in particular for analyzing an eye. By use of an interferometer, which includes an optical reference path and an optical sample path, a sample beam scans a measuring region of a sample, in particular of an eye, so as to generate a deep sectional image. The optical and geometric paths in a sample arm and/or reference arm of the interferometer can be switched quickly between two or more positions. The path length of the sample beam and/or of the reference beam is changed by way of a path length switching unit, deep sectional images are generated at least at two different depths of the sample, and the change of the path length in the switching unit takes place by deflection of the beam paths to different geometric paths.