Abstract: The invention relates to a method for laser-microscopic magnification of objects, and to a device for implementing the method. In particular, organic, elastic or insulating objects, as well as their surface structures, can be examined down to the nanometer range by this method in a contactless manner and without preparation, and the optical signals generated can be processed with little technical effort. To this end, the specimens are irradiated with a laser beam which has previously been expanded to a larger beam diameter via an expanding lens system (3) and subsequently focused to the smallest possible beam diameter by means of a focusing lens (5) of short focal length. The object can be screened in this context. The intensity of the reflected light and scattered light (6) is detected at a very large solid angle, preferably on the inner surface of one of two hemispherical bowls with direct or indirect photosensors. Optical fibers can be used as photosensors.

Abstract: A nephelometer wherein a laser beam is split to define reference and sample beams. The reference beam is directed to a photodetector and the sample beam is passed through a test sample, the emerging beam being directed to a separate photodetector. The output from the respective photodetectors are compared via a comparator, and the comparator output is divided by the reference beam photodetector output to provide a recordable signal. Preferably, the photodetectors are dispersed within Ulbrecht type spheres whereby they are indirectly irradiated by the respective beam. The invention is particularly effective for measuring turbidities of very minute degree.

Abstract: Process and apparatus for determining the presence and location of inclusions within gems. A gem is initially scanned or irradiated along X and Y co-ordinates by a light bundle whose cross-section perpendicular to the scanning tracks is at least equal to the spacing between adjacent tracks. The intensity of light passing through the gem is measured to determine the possible existence of any inclusions. The gem and the source of light are next moved relative to each other along the Z co-ordinate, so that the focal point of the light rays moves within the gem to pinpoint the location of any inclusions therein.