Patents by Inventor Gert Wo 'T Hooft

Gert Wo 'T Hooft has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical frequency domain reflectometry (OFDR) system
    Patent number: 9553664
    Abstract: There is presented an optical frequency domain reflectometry (OFDR) system (100) comprising a first coupling point (15) arranged for splitting radiation into two parts, so that radiation may be emitted into a reference path (16) and a measurement path (17). The system further comprises an optical detection unit (30) capable of obtaining a signal from the combined optical radiation from the reference path and the measurement path via a second coupling point (25). The measurement path (17) comprises a polarization dependent optical path length shifter (PDOPS, PDFS, 10), which may create a first polarization (PI) and a second polarization (P2) for the radiation in the measurement path, where the optical path length is different for the first and second polarizations in the measurement path. This may be advantageous for obtaining an improved optical frequency domain reflectometry (OFDR) system where e.g. the two measurements for input polarizations may be performed in the same scan of a radiation source.
    Type: Grant
    Filed: September 16, 2013
    Date of Patent: January 24, 2017
    Assignee: Koninklijke Philips N.V.
    Inventors: Jeroen Jan Lambertus Horikx, Gert Wo 'T Hooft, Milan Jan Henri Marell
  • OPTICAL FREQUENCY DOMAIN REFLECTOMETRY (OFDR) SYSTEM
    Publication number: 20150263804
    Abstract: There is presented an optical frequency domain reflectometry (OFDR) system (100) comprising a first coupling point (15) arranged for splitting radiation into two parts, so that radiation may be emitted into a reference path (16) and a measurement path (17). The system further comprises an optical detection unit (30) capable of obtaining a signal from the combined optical radiation from the reference path and the measurement path via a second coupling point (25). The measurement path (17) comprises a polarization dependent optical path length shifter (PDOPS, PDFS, 10), which may create a first polarization (PI) and a second polarization (P2) for the radiation in the measurement path, where the optical path length is different for the first and second polarizations in the measurement path. This may be advantageous for obtaining an improved optical frequency domain reflectometry (OFDR) system where e.g. the two measurements for input polarizations may be performed in the same scan of a radiation source.
    Type: Application
    Filed: September 16, 2013
    Publication date: September 17, 2015
    Inventors: Jeroen Jan Lambertus Horikx, Gert Wo 'T Hooft, Milan Jan Henri Marell