Patents by Inventor Ghislain Pascal

Ghislain Pascal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measurement of three-dimensional objects by single-view backlit shadowgraphy
    Patent number: 7307740
    Abstract: A method for measuring three-dimensional objects by single view backlit shadowgraphy. To measure at least one geometrical parameter of such an object, for example the thickness of a hollow sphere, translucent or transparent to visible light, optical characteristics of the object are determined, by which at least one optical model of the propagation of light through the object is established. This model includes an equation that relates the parameter to the result of an observation directly performed on an image of the object, the object being acquired by observing the object by single view backlit shadowgraphy. The image is acquired, the observation is performed, and the parameter is determined by the equation and the result of the observation.
    Type: Grant
    Filed: March 10, 2004
    Date of Patent: December 11, 2007
    Assignee: Commissariat A l'Energie Atomique
    Inventors: Francis Lamy, Ghislain Pascal, Yvon Voisin, Alain Diou
  • Method for measurement of three-dimensional objects by single-view backlit shadowgraphy
    Publication number: 20060215180
    Abstract: A method for measuring three-dimensional objects by single view backlit shadowgraphy. To measure at least one geometrical parameter of such an object, for example the thickness of a hollow sphere, translucent or transparent to visible light, optical characteristics of the object are determined, by which at least one optical model of the propagation of light through the object is established. This model includes an equation that relates the parameter to the result of an observation directly performed on an image of the object, the object being acquired by observing the object by single view backlit shadowgraphy. The image is acquired, the observation is performed, and the parameter is determined by the equation and the result of the observation.
    Type: Application
    Filed: March 10, 2004
    Publication date: September 28, 2006
    Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE
    Inventors: Francis Lamy, Ghislain Pascal, Yvon Voisin, Alain Diou