Abstract: A semiconductor device includes a substrate including a first region, and a second region, a first gate structure and a second gate structure on the substrate of the first region, a third gate structure and a fourth gate structure on the substrate of the second region, a first interlayer insulating film on the substrate of the first region and including a first lower interlayer insulating film and a first upper interlayer insulating film, a second interlayer insulating film on the substrate of the second region and including a second lower interlayer insulating film and a second upper interlayer insulating film, a first contact between the first gate structure and the second gate structure and within the first interlayer insulating film, and a second contact formed between the third gate structure and the fourth gate structure and within the second interlayer insulating film.

Abstract: Disclosed is a digital measurement apparatus including a holding unit on which a measurement object to be measured is placed; and a measurement unit for measuring the measurement object by comparing an image of the measurement object placed on the holding unit with a preset reference value, and providing a reference for adjusting the length of a new measurement object based on a measured value of the measurement object. With this configuration, regardless of photographing conditions, by performing calibration using a set reference value, the accuracy of a measured value may be improved.

Abstract: Disclosed is a digital measurement apparatus including a holding unit on which a measurement object to be measured is placed; and a measurement unit for measuring the measurement object by comparing an image of the measurement object placed on the holding unit with a preset reference value, and providing a reference for adjusting the length of a new measurement object based on a measured value of the measurement object. With this configuration, regardless of photographing conditions, by performing calibration using a set reference value, the accuracy of a measured value may be improved.

Abstract: Disclosed is a digital measurement apparatus including a holding unit on which a measurement object to be measured is placed; and a measurement unit for measuring the measurement object by comparing an image of the measurement object placed on the holding unit with a preset reference value, and providing a reference for adjusting the length of a new measurement object based on a measured value of the measurement object. With this configuration, regardless of photographing conditions, by performing calibration using a set reference value, the accuracy of a measured value may be improved.