Patents by Inventor Gi Y. Jeon

Gi Y. Jeon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Chip-lifetime testing instrument for semiconductor devices
    Patent number: 5291127
    Abstract: A chip-lifetime testing instrument for semiconductor devices which can detect defective chips by testing the performance and electrical lifetime of the chips in manufacturing process of the semiconductor devices, so that the manufacturing cost can be reduced and unnecessary processes for packaging of defective chips can be avoided, thereby reducing the necessary space for the set-up of the testing instrument.
    Type: Grant
    Filed: October 17, 1991
    Date of Patent: March 1, 1994
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Khee Park, Jin H. Yoon, Oh S. Kwon, Gi Y. Jeon