Abstract: Methods, systems, and computer program products for initializing one or more components of a system, the system comprising an integrated circuit that comprises at least one processor, are disclosed. A method includes initializing at least one component of the system, determining a temperature of the integrated circuit using a temperature sensing device embedded on the integrated circuit, comparing the determined temperature to a predetermined suitable temperature operating range of at least one additional component to yield a comparison result, and initializing the at least one additional component based on the comparison result. The at least one additional component may be initialized on the condition that the determined temperature of the integrated circuit is within the predetermined suitable temperature operating range of the at least one additional component.

Abstract: Methods, systems, and computer program products for initializing one or more components of a system, the system comprising an integrated circuit that comprises at least one processor, are disclosed. A method includes initializing at least one component of the system, determining a temperature of the integrated circuit using a temperature sensing device embedded on the integrated circuit, comparing the determined temperature to a predetermined suitable temperature operating range of at least one additional component to yield a comparison result, and initializing the at least one additional component based on the comparison result. The at least one additional component may be initialized on the condition that the determined temperature of the integrated circuit is within the predetermined suitable temperature operating range of the at least one additional component.

Abstract: Methods, systems, and computer program products for initializing one or more components of a system, the system comprising an integrated circuit that comprises at least one processor, are disclosed. A method includes initializing at least one component of the system, determining a temperature of the integrated circuit using a temperature sensing device embedded on the integrated circuit, comparing the determined temperature to a predetermined suitable temperature operating range of at least one additional component to yield a comparison result, and initializing the at least one additional component based on the comparison result. The at least one additional component may be initialized on the condition that the determined temperature of the integrated circuit is within the predetermined suitable temperature operating range of the at least one additional component.

Abstract: Methods, systems, and computer program products for initializing one or more components of a system, the system comprising an integrated circuit that comprises at least one processor, are disclosed. A method includes initializing at least one component of the system, determining a temperature of the integrated circuit using a temperature sensing device embedded on the integrated circuit, comparing the determined temperature to a predetermined suitable temperature operating range of at least one additional component to yield a comparison result, and initializing the at least one additional component based on the comparison result. The at least one additional component may be initialized on the condition that the determined temperature of the integrated circuit is within the predetermined suitable temperature operating range of the at least one additional component.

Abstract: A computer implemented method, apparatus and computer program product for extending test coverage in a simulated multiple core integrated circuit. The simulator applies at a first time a first test vector on the simulated multiple core integrated circuit, the first test vector having a duration. The simulator may also apply a second test vector at a second time before the duration but substantially after the first time. The simulator can collect a response from the multiple core integrated circuit based on the first test vector and the second test vector.

Abstract: A computer implemented method, apparatus and computer program product for extending test coverage in a simulated multiple core integrated circuit. The simulator applies at a first time a first test vector on the simulated multiple core integrated circuit, the first test vector having a duration. The simulator may also apply a second test vector at a second time before the duration but substantially after the first time. The simulator can collect a response from the multiple core integrated circuit based on the first test vector and the second test vector.