Patents by Inventor Gideon Rosenfeld

Gideon Rosenfeld has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6360005
    Abstract: A defect detection system for inspecting objects such as reticles, photomasks, semiconductor wafers, flat panel displays and other patterned objects has two or more stages, whereby the object is examined separately for fine defects, by inspecting a binary level representation of the object, and for ultra fine defects, by inspecting a gray level representation of the object. The system also includes re-inspection apparatus for re-inspection of detected defects, thereby to reduce the false alarm rate, and for classifying the remaining defects by size, area and type.
    Type: Grant
    Filed: July 12, 1996
    Date of Patent: March 19, 2002
    Assignee: Applied Materials, Inc.
    Inventors: Meir Aloni, Amir Alon, Yair Eran, Itzhak Katz, Yigal Katzir, Gideon Rosenfeld
  • Patent number: 5619429
    Abstract: An inspection method including the steps of providing a patterned object to be inspected and compared with a reference, inspecting the patterned object and providing an output of information relating to the visual characteristics of the patterned object, comparing binary level information relating to the visual characteristics of the patterned object to binary level information relating to the visual characteristics of the reference, and comparing gray level information relating to the visual characteristics of the patterned object to gray level information relating to the visual characteristics of the reference.
    Type: Grant
    Filed: November 27, 1991
    Date of Patent: April 8, 1997
    Assignee: Orbot Instruments Ltd.
    Inventors: Meir Aloni, Amir Alon, Yair Eran, Itzhak Katz, Yigal Katzir, Gideon Rosenfeld
  • Patent number: 5586058
    Abstract: The present invention seeks to provide an improved system for inspection of and detection of defects in objects such as reticles, photomasks, semiconductor wafers, flat panel displays and other patterned objects. Preferably, the system has two or more stages, whereby the object is examined separately for fine defects, preferably by inspecting a binary level representation of the object, and for ultra fine defects, preferably by inspecting a gray level representation of the object. The system also preferably includes reinspection apparatus for reinspection of detected defects, thereby to reduce the false alarm rate, and for classifying the remaining defects by size, area and type.
    Type: Grant
    Filed: April 21, 1992
    Date of Patent: December 17, 1996
    Assignee: Orbot Instruments Ltd.
    Inventors: Meir Aloni, Amir Alon, Yair Eran, Itzhak Katz, Yigal Katzir, Gideon Rosenfeld
  • Patent number: 4456924
    Abstract: To produce a screened color separation having any screen angle, an original picture is scanned to generate a set of picture values which are digitized and stored. Also a screen function is generated and stored representing a complete two-dimensional period of half-tone screen in the form of a grid-like array of grey-tone values, the mesh of the grid-like array being finer than the scanning raster. To expose a reproduction medium, the screen function values are superimposed on the picture values to develop exposure signals for an exposing plotter. The screen angle is selected by virtually rotating the stored screen function data through the selected angle as it is being recalled from memory.
    Type: Grant
    Filed: May 3, 1982
    Date of Patent: June 26, 1984
    Assignee: Scitex Corporation Ltd.
    Inventor: Gideon Rosenfeld
  • Patent number: 4350996
    Abstract: To produce a screened color separation having any screen angle, an original picture is scanned to generate a set of picture values which are digitized and stored. Also a screen function is generated and stored representing a complete two-dimensional period of a half-tone screen in the form of a grid-like array of grey-tone values, the mesh of the grid-like array being finer than the scanning raster. To expose a reproduction medium, the screen function values are superimposed on the picture values to develop exposure signals for an exposing plotter. The screen angle is selected by virtually rotating the stored screen function data through the selected angle as it is being recalled from memory.
    Type: Grant
    Filed: April 14, 1980
    Date of Patent: September 21, 1982
    Assignee: Scitex Corporation Ltd.
    Inventor: Gideon Rosenfeld