Patents by Inventor Gijs SMIT

Gijs SMIT has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250200719
    Abstract: Systems and methods for reducing charging artifacts in an inspection image include obtaining a set of inspection images, in which each of the set of inspection images includes a charging artifact; and training a machine learning model using the set of inspection images as input, in which the machine learning model outputs a set of decoupled features of the set of inspection images.
    Type: Application
    Filed: May 8, 2023
    Publication date: June 19, 2025
    Applicant: ASML Netherlands B.V.
    Inventors: Jasper Frans Mathijs VAN RENS, Gijs SMIT, Antoine Gaston Marie KIERS, Vlado MENKOVSKI