Abstract: Data storage devices, such as solid state drives (SSDs), are disclosed. A read threshold calibration operation is utilized to generate a calibrated read threshold for one or more voltage states of a cell of a MLC memory. A single-level cell (SLC) read is then executed to sense the ratio of bit values at the read thresholds of the voltage states, where SLC read refers to reading at a single read threshold, rather than to the cell type. The sensing results in a binary page with certain statistics of 1's and 0's. The ratio of 1's (or 0's) in the binary page is used to determine a deviation from the expected ratio, where the deviation is used to adjust the calibrated read threshold to match the voltage states of the MLC memory.

Abstract: The present disclosure generally relates to data storage devices, such as solid state drives (SSDs). A read threshold calibration operation is utilized to generate a calibrated read threshold for one or more voltage states of a cell of a MLC memory. A single-level cell (SLC) read is then executed to sense the ratio of bit values at the read thresholds of the voltage states, where SLC read refers to reading at a single read threshold, rather than to the cell type. The sensing results in a binary page with certain statistics of 1's and 0's. The ratio of 1's (or 0's) in the binary page is used to determine a deviation from the expected ratio, where the deviation is used to adjust the calibrated read threshold to match the voltage states of the MLC memory.