Abstract: A device and method of determining the electrical properties of an electrical device, including taking of at least one measurement of an electrical measured quantity at one or more brought-out electrical connections of each of several equipotential bodies of the electrical device, wherein measurement of the electrical measured quantity of certain equipotential bodies on at least one other brought-out electrical connection of the equipotential body concerned is not performed if a defect, which if appropriate is to be detected, of the relevant equipotential body in the area of this other connection, influences the electrical measured quantity more strongly than a tolerance of the measurement of this measured quantity.

Abstract: The invention relates to a method for the testing of circuit boards using a testing apparatus which has a test set-up for contacting the circuit board test points of a circuit board to be tested. The test set-up has test contact elements in a predetermined regular grid.

Abstract: To determine electrical properties of an electrical device (10), in each case one measurement (110) of an electrical measured quantity is made on at least one brought-out electrical connection (46, 48) of one of several equipotential bodies (20, 26) of the electrical device (10). The measurement (110) of the electrical measured quantity of certain equipotential bodies (20) is not performed on at least one other brought-out electrical connection (46) of the equipotential body (20) concerned if a defect, which is if appropriate to be detected, of the relevant equipotential body (20) in the area of this other connection (60), influences the electrical measured quantity (C) more strongly than a tolerance of the measurement of this measured quantity (C).