Abstract: An optical component focus testing apparatus includes a plurality of test pattern displays. One or more illuminators are configured to selectively illuminate different test pattern displays at different times. Light directors are provided to direct light from at least one of the illuminated test pattern displays towards an optical component under test. The light directors and test pattern displays are arranged such that, in use, light directed from different illuminated test pattern displays travel different distances to reach the optical component under test.

Abstract: An image sensor may have a pixel array and an imaging lens for forming an image on the pixel array. The sensor may also include a pixel readout unit for enabling individual pixel values to be readout. The sensor may further include a pixel selection unit wherein at least one pixel sub-array is selected according to the pixel values readout and the at least one sub-array is used for reading the image.

Abstract: A lens assembly for an imaging device may include a lens member for focusing external radiation towards an image sensor of the imaging device, and a screen member adjacent the lens member. A transparent portion may be positioned between the lens member and the external radiation and may have first and second surfaces. A first mask member may be positioned at the first surface of the transparent portion and may have an inlet therein. A second mask member may be positioned at the second surface of the transparent portion and may have an outlet therein. The outlet may be smaller than the inlet.

Abstract: An optical component focus testing apparatus includes a plurality of test pattern displays. One or more illuminators are configured to selectively illuminate different test pattern displays at different times. Light directors are provided to direct light from at least one of the illuminated test pattern displays towards an optical component under test. The light directors and test pattern displays are arranged such that, in use, light directed from different illuminated test pattern displays travel different distances to reach the optical component under test.