Patents by Inventor Gintas Vilkelis

Gintas Vilkelis has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6541836
    Abstract: An avalanche drift photodetector (ADP) incorporates extremely low capacitance of a silicon drift photodetector (SDP) and internal gain that mitigates the surface leakage current noise of an avalanche photodetector (APD). The ADP can be coupled with scintillators such as CsI(Tl), NaI(Tl), LSO or others to form large volume scintillation type gamma ray detectors for gamma ray spectroscopy, photon counting, gamma ray counting, etc. Arrays of the ADPs can be used to replace the photomultiplier tubes (PMTs) used in conjunction with scintillation crystals in conventional gamma cameras for nuclear medical imaging.
    Type: Grant
    Filed: April 16, 2001
    Date of Patent: April 1, 2003
    Assignee: Photon Imaging, Inc.
    Inventors: Jan Iwanczyk, Bradley E. Patt, Gintas Vilkelis
  • Publication number: 20020139970
    Abstract: An avalanche drift photodetector (ADP) incorporates extremely low capacitance of a silicon drift photodetector (SDP) and internal gain that mitigates the surface leakage current noise of an avalanche photodetector (APD). The ADP can be coupled with scintillators such as CsI(Tl), NaI(Tl), LSO or others to form large volume scintillation type gamma ray detectors for gamma ray spectroscopy, photon counting, gamma ray counting, etc. Arrays of the ADPs can be used to replace the photomultiplier tubes (PMTs) used in conjunction with scintillation crystals in conventional gamma cameras for nuclear medical imaging.
    Type: Application
    Filed: April 16, 2001
    Publication date: October 3, 2002
    Inventors: Jan Iwanczyk, Bradley E. Patt, Gintas Vilkelis
  • Patent number: 6455858
    Abstract: A semiconductor radiation detector is provided to detect x-ray and light photons. The entrance electrode is segmented by using variable doping concentrations. Further, the entrance electrode is physically segmented by inserting n+ regions between p+ regions. The p+ regions and the n+ regions are individually biased. The detector elements can be used in an array, and the p+ regions and the n+ regions can be biased by applying potential at a single point. The back side of the semiconductor radiation detector has an n+ anode for collecting created charges and a number of p+ cathodes. Biased n+ inserts can be placed between the p+ cathodes, and an internal resistor divider can be used to bias the n+ inserts as well as the p+ cathodes. A polysilicon spiral guard can be implemented surrounding the active area of the entrance electrode or surrounding an array of entrance electrodes.
    Type: Grant
    Filed: August 13, 2000
    Date of Patent: September 24, 2002
    Assignee: Photon Imaging, Inc.
    Inventors: Bradley E. Patt, Jan S. Iwanczyk, Carolyn R. Tull, Gintas Vilkelis