Patents by Inventor Giorgi Muchaidze

Giorgi Muchaidze has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Using computer-aided design layout in scanning system
    Patent number: 10325057
    Abstract: A system and method for testing a device under test (DUT) combines measurement data of field components values made at different sampling locations away from the DUT with computer-aided design layout of the DUT. The combined computer-aided design layout of the DUT and the measurement data can then be displayed for analysis.
    Type: Grant
    Filed: August 17, 2016
    Date of Patent: June 18, 2019
    Assignee: AMBER PRECISION INSTRUMENTS, INC.
    Inventors: Giorgi Muchaidze, Besarion Chikhradze, Hamed Kajbaf
  • System and method for electrostatic discharge testing of devices under test
    Patent number: 9599649
    Abstract: A system and method for electrostatic discharge (ESD) testing devices under test (DUTs) uses an ESD gun attached to a robotic arm to execute ESD testing processes. The system and method also uses a relay station to place a DUT after an ESD testing process is performed on one major side of the DUT so the ESD testing can be performed on the other major side of the DUT.
    Type: Grant
    Filed: August 6, 2014
    Date of Patent: March 21, 2017
    Inventors: Kyung Jin Min, David J. Pommerenke, Giorgi Muchaidze, Besarion Chikhradze, Iuri Kalandarishvili
  • USING COMPUTER-AIDED DESIGN LAYOUT IN SCANNING SYSTEM
    Publication number: 20170068771
    Abstract: A system and method for testing a device under test (DUT) combines measurement data of field components values made at different sampling locations away from the DUT with computer-aided design layout of the DUT. The combined computer-aided design layout of the DUT and the measurement data can then be displayed for analysis.
    Type: Application
    Filed: August 17, 2016
    Publication date: March 9, 2017
    Inventors: Giorgi Muchaidze, Besarion Chikhradze, Hamed Kajbaf
  • System and method for measuring near field information of device under test
    Patent number: 9244145
    Abstract: A system and method for measuring near field information of a device under test (DUT) uses a reference probe and a measurement probe that are configured to sense a field. A probe calibration factor is used to determine corresponding field values for signals from the measurement probe at sampling locations about the DUT. The probe calibration factor is derived from measured signals about a conductive trace using a probe and simulated field information for the conductive trace when subjected to a simulated reference signal.
    Type: Grant
    Filed: July 2, 2012
    Date of Patent: January 26, 2016
    Assignee: Amber Precision Instruments, Inc.
    Inventors: Kyung Jin Min, Giorgi Muchaidze, Besarion Chikhradze
  • SYSTEM AND METHOD FOR ELECTROSTATIC DISCHARGE TESTING OF DEVICES UNDER TEST
    Publication number: 20140347079
    Abstract: A system and method for electrostatic discharge (ESD) testing devices under test (DUTs) uses an ESD gun attached to a robotic arm to execute ESD testing processes. The system and method also uses a relay station to place a DUT after an ESD testing process is performed on one major side of the DUT so the ESD testing can be performed on the other major side of the DUT.
    Type: Application
    Filed: August 6, 2014
    Publication date: November 27, 2014
    Inventors: Kyung Jin Min, David J. Pommerenke, Giorgi Muchaidze, Besarion Chikhradze, Iuri Kalandarishvili
  • System and method for electrostatic discharge testing of devices under test
    Patent number: 8823383
    Abstract: A system and method for electrostatic discharge (ESD) testing devices under test (DUTs) uses an ESD gun attached to a robotic arm to execute ESD tests. The system and method also uses cameras positioned around a DUT placed on a testing table to define at least one test point on a surface of the DUT. Using the defined test point, as well as settings on the ESD gun and a testing process scenario that includes actions to be executed by the system, the testing process is performed by the system.
    Type: Grant
    Filed: May 2, 2012
    Date of Patent: September 2, 2014
    Inventors: Kyung Jin Min, David J. Pommerenke, Giorgi Muchaidze, Besarion Chikhradze, Iuri Kalandarishvili
  • SYSTEM AND METHOD FOR MEASURING NEAR FIELD INFORMATION OF DEVICE UNDER TEST
    Publication number: 20130002275
    Abstract: A system and method for measuring near field information of a device under test (DUT) uses a reference probe and a measurement probe that are configured to sense a field. A probe calibration factor is used to determine corresponding field values for signals from the measurement probe at sampling locations about the DUT. The probe calibration factor is derived from measured signals about a conductive trace using a probe and simulated field information for the conductive trace when subjected to a simulated reference signal.
    Type: Application
    Filed: July 2, 2012
    Publication date: January 3, 2013
    Inventors: Kyung Jin Min, Giorgi Muchaidze, Besarion Chikhradze
  • SYSTEM AND METHOD FOR ELECTROSTATIC DISCHARGE TESTING OF DEVICES UNDER TEST
    Publication number: 20130002273
    Abstract: A system and method for electrostatic discharge (ESD) testing devices under test (DUTs) uses an ESD gun attached to a robotic arm to execute ESD tests. The system and method also uses cameras positioned around a DUT placed on a testing table to define at least one test point on a surface of the DUT. Using the defined test point, as well as settings on the ESD gun and a testing process scenario that includes actions to be executed by the system, the testing process is performed by the system.
    Type: Application
    Filed: May 2, 2012
    Publication date: January 3, 2013
    Inventors: Kyung Jin Min, David J. Pommerenke, Giorgi Muchaidze, Besarion Chikhradze, Iuri Kalandarishvili