Abstract: A circuit comprises first and second input supply nodes configured to receive a supply voltage therebetween. The circuit comprises a high-side driver circuit configured to be coupled to a high-side switch and produce a first signal between first and second high-side output nodes. The circuit comprises a low-side driver circuit configured to be coupled to a low-side switch and produce a second signal between first and second low-side output nodes. The circuit comprises a floating node configured to receive a floating voltage applied between the floating node and the second high-side output node, a bootstrap diode between the first input supply node and an intermediate node, and a current limiter circuit between the intermediate node and the floating node and configured to sense the floating voltage and counter a current flow from the intermediate node to the floating node as a result of the floating voltage reaching a threshold value.

Abstract: A circuit comprises first and second input supply nodes configured to receive a supply voltage therebetween. The circuit comprises a high-side driver circuit configured to be coupled to a high-side switch and produce a first signal between first and second high-side output nodes. The circuit comprises a low-side driver circuit configured to be coupled to a low-side switch and produce a second signal between first and second low-side output nodes. The circuit comprises a floating node configured to receive a floating voltage applied between the floating node and the second high-side output node, a bootstrap diode between the first input supply node and an intermediate node, and a current limiter circuit between the intermediate node and the floating node and configured to sense the floating voltage and counter a current flow from the intermediate node to the floating node as a result of the floating voltage reaching a threshold value.

Abstract: A circuit comprises first and second input supply nodes configured to receive a supply voltage therebetween. The circuit comprises a high-side driver circuit configured to be coupled to a high-side switch and produce a first signal between first and second high-side output nodes. The circuit comprises a low-side driver circuit configured to be coupled to a low-side switch and produce a second signal between first and second low-side output nodes. The circuit comprises a floating node configured to receive a floating voltage applied between the floating node and the second high-side output node, a bootstrap diode between the first input supply node and an intermediate node, and a current limiter circuit between the intermediate node and the floating node and configured to sense the floating voltage and counter a current flow from the intermediate node to the floating node as a result of the floating voltage reaching a threshold value.

Abstract: A circuit comprises first and second input supply nodes configured to receive a supply voltage therebetween. The circuit comprises a high-side driver circuit configured to be coupled to a high-side switch and produce a first signal between first and second high-side output nodes. The circuit comprises a low-side driver circuit configured to be coupled to a low-side switch and produce a second signal between first and second low-side output nodes. The circuit comprises a floating node configured to receive a floating voltage applied between the floating node and the second high-side output node, a bootstrap diode between the first input supply node and an intermediate node, and a current limiter circuit between the intermediate node and the floating node and configured to sense the floating voltage and counter a current flow from the intermediate node to the floating node as a result of the floating voltage reaching a threshold value.

Abstract: The present invention relates to a process for the synthesis of partially and fully fluorinated polyether (PFPE) polymers, to PFPE polymers obtained therefrom and to the use of said PFPE polymers as intermediate compounds for the manufacture of additives for plastic and glass coating.

Abstract: The present invention relates to a process for the synthesis of partially and fully fluorinated polyether (PFPE) polymers comprising cyclic moieties in the backbone chain, to PFPE polymers obtained therefrom and to the use of said PFPE polymers as intermediate compounds for the manufacture of additives for plastic and glass coating.

Abstract: The present invention relates to a novel process for the synthesis of (per)fluoropolyether polymers and to certain novel (per)fluoropolyether polymers. The present invention also relates to the use the (per)fluoropolyether polymers thus obtained, as intermediate compounds for the manufacture of further polymers suitable for use as lubricants, notably for magnetic recording media (MRM).

Abstract: A fluorinated aromatic sulfone polymer [polymer (F-PS)] comprising: recurring units [units (A)] derived from at least one dihalo-diaryl sulfone [monomer (A)]; recurring units [units (B)] derived from at least one aromatic diol [monomer (B)]; at least one unit [units (PFPE)] derived from at least one fully or partially fluorinated polyether alcohol (PFPE alcohol), said polymer (F-PS) having a fluorine content ranging from 0.1% to 10% wt, is herein disclosed. Films and membranes obtained from (F-PS) are also disclosed, as well as their use in filtration methods.

Abstract: The present invention relates to a novel process for the synthesis of (per)fluoropolyether polymers and to certain novel (per)fluoropolyether polymers. The present invention also relates to the use the (per)fluoropolyether polymers thus obtained, as intermediate compounds for the manufacture of further polymers suitable for use as lubricants, notably for magnetic recording media (MRM).

Abstract: Systems and methods for intra-sector re-ordered wear leveling include: detecting, in a memory device, a high wear sub-sector having a high wear level, the sub-sector residing in a first sector; determining a second sector of the memory device having a low wear level; swapping the first sector with the second sector; and re-ordering a position of at least one sub-sector of the first sector, the second sector, or both.

Abstract: Systems and methods for intra-sector re-ordered wear leveling include: detecting, in a memory device, a high wear sub-sector having a high wear level, the sub-sector residing in a first sector; determining a second sector of the memory device having a low wear level; swapping the first sector with the second sector; and re-ordering a position of at least one sub-sector of the first sector, the second sector, or both.

Abstract: Methods of wear leveling in a memory, and memories configured to perform such methods, are useful in extending cycling endurance in memories. Such methods include transferring data from a first block of the memory to a second block of the memory, erasing the first block, transferring data from a third block of the memory to the first block, erasing the third block, transferring data from the second block to the third block, swapping logical addresses for the first block and the third block with each other, and erasing the second block. Transferring data from the third block to the first block excludes a sub-sector of the third block that is to be erased.

Abstract: A method is for operating a cryptographic device to reduce effects of power analysis and time attacks. The method may include executing a first set of cryptographic algorithm computations with a first crypto-processor of the cryptographic device. The first set of cryptographic algorithm computations may provide encryption of a first set of data to be protected with a first secret key stored in the cryptographic device. The method may further include executing a second set of cryptographic algorithm computations with a second crypto-processor of the cryptographic device for providing encryption of a second set of data different from the first set of data to be protected with a second different secret key.

Abstract: Systems and methods for intra-sector re-ordered wear leveling include: detecting, in a memory device, a high wear sub-sector having a high wear level, the sub-sector residing in a first sector; determining a second sector of the memory device having a low wear level; swapping the first sector with the second sector; and re-ordering a position of at least one sub-sector of the first sector, the second sector, or both.

Abstract: Methods of wear leveling in a memory, and memories configured to perform such methods, are useful in extending cycling endurance in memories. Such methods include transferring data from a first block of the memory to a second block of the memory, erasing the first block, transferring data from a third block of the memory to the first block, erasing the third block, transferring data from the second block to the third block, swapping logical addresses for the first block and the third block with each other, and erasing the second block. Transferring data from the third block to the first block excludes a sub-sector of the third block that is to be erased.

Abstract: Decoding blocks, memories, and methods for decoding pre-decoded address information are disclosed. One such decoding block includes a first latch and voltage shift circuit configured to receive first pre-decoded address information at first voltage levels and further configured to latch the first pre-decoded address information and shift the voltage levels of the same to second voltage levels. An address decoder includes a second latch and voltage shift circuit configured to receive second pre-decoded address information at the first voltage levels and latch and shift the voltage levels of the same to the second voltage levels. The address decoder is further configured to select control gates of the memory cells of the memory based at least in part on the first and second pre-decoded address information.

Abstract: Methods and memories for wear leveling by sub-sectors of a block are provided. In one such method, data are transferred from a first block of the memory to a second block of the memory, excluding a sub-sector of the first block that is to be erased, logical addresses for the first block and the second block are swapped with each other, the first block is erased, data are transferred from a third block to the first block, logical addresses for the first block and the third block are swapped with each other, and the third block is erased.

Abstract: Methods and memories for wear leveling by sub-sectors of a block are provided. In one such method, data are transferred from a first block of the memory to a second block of the memory, excluding a sub-sector of the first block that is to be erased, logical addresses for the first block and the second block are swapped with each other, the first block is erased, data are transferred from a third block to the first block, logical addresses for the first block and the third block are swapped with each other, and the third block is erased.

Abstract: A method for protecting data against power analysis attacks includes at least a first phase of executing a cryptographic operation for ciphering data in corresponding enciphered data through a secret key. The method includes at least a second phase of executing an additional cryptographic operation for ciphering additional data in corresponding enciphered additional data. An execution of the first and second phases is undistinguishable by the data power analysis attacks. Secret parameters are randomly generated and processed by the at least one second phase. The secret parameters include an additional secret key ERK for ciphering the additional data in the corresponding enciphered additional data.

Abstract: Decoding blocks, memories, and methods for decoding pre-decoded address information are disclosed. One such decoding block includes a first latch and voltage shift circuit configured to receive first pre-decoded address information at first voltage levels and further configured to latch the first pre-decoded address information and shift the voltage levels of the same to second voltage levels. An address decoder includes a second latch and voltage shift circuit configured to receive second pre-decoded address information at the first voltage levels and latch and shift the voltage levels of the same to the second voltage levels. The address decoder is further configured to select control gates of the memory cells of the memory based at least in part on the first and second pre-decoded address information.