Patents by Inventor Girijesh Kumar Yadava

Girijesh Kumar Yadava has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9374565
    Abstract: A method includes acquiring projection data of an object from a plurality of detector elements, reconstructing the acquired projection data into a first reconstructed image, and performing material characterization of an image volume of the first reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. Performing material characterization includes utilizing a generalized modeling function to estimate a fraction of at least one basis material within each voxel of the image volume. The method also includes generating a re-mapped image volume for the at least one basis material of the two basis materials, performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection, and generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials.
    Type: Grant
    Filed: November 6, 2014
    Date of Patent: June 21, 2016
    Assignee: General Electric Company
    Inventors: Hewei Gao, Girijesh Kumar Yadava, Adam Israel Cohen, Yannan Jin
  • Publication number: 20160134852
    Abstract: A method includes acquiring projection data of an object from a plurality of detector elements, reconstructing the acquired projection data into a first reconstructed image, and performing material characterization of an image volume of the first reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. Performing material characterization includes utilizing a generalized modeling function to estimate a fraction of at least one basis material within each voxel of the image volume. The method also includes generating a re-mapped image volume for the at least one basis material of the two basis materials, performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection, and generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials.
    Type: Application
    Filed: November 6, 2014
    Publication date: May 12, 2016
    Inventors: Hewei Gao, Girijesh Kumar Yadava, Adam Israel Cohen, Yannan Jin
  • Patent number: 9025815
    Abstract: A method is provided. The method includes acquiring projection data of an object from a plurality of pixels, reconstructing the acquired projection data from the plurality of pixels into a reconstructed image, performing material characterization and decomposition of an image volume of the reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. The method also includes generating a re-mapped image volume for at least one basis material of the two basis materials, and performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection. The method further includes generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials, wherein the multi-material corrected projections include linearized projections.
    Type: Grant
    Filed: July 15, 2014
    Date of Patent: May 5, 2015
    Assignee: General Electric Company
    Inventors: Xiaoye Wu, Jiang Hsieh, Paavana Sainath, Dan Xu, Yannan Jin, Girijesh Kumar Yadava, Adam Israel Cohen, Hewei Gao
  • Publication number: 20140328448
    Abstract: A method is provided. The method includes acquiring projection data of an object from a plurality of pixels, reconstructing the acquired projection data from the plurality of pixels into a reconstructed image, performing material characterization and decomposition of an image volume of the reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. The method also includes generating a re-mapped image volume for at least one basis material of the two basis materials, and performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection. The method further includes generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials, wherein the multi-material corrected projections include linearized projections.
    Type: Application
    Filed: July 15, 2014
    Publication date: November 6, 2014
    Inventors: Xiaoye Wu, Jiang Hsieh, Paavana Sainath, Dan Xu, Yannan Jin, Girijesh Kumar Yadava, Adam Israel Cohen, Hewei Gao
  • Patent number: 8811709
    Abstract: A method is provided. The method includes acquiring projection data of an object from a plurality of pixels, reconstructing the acquired projection data from the plurality of pixels into a reconstructed image, performing material characterization and decomposition of an image volume of the reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. The method also includes generating a re-mapped image volume for at least one basis material of the two basis materials, and performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection. The method further includes generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials, wherein the multi-material corrected projections include linearized projections.
    Type: Grant
    Filed: November 14, 2012
    Date of Patent: August 19, 2014
    Assignee: General Electric Company
    Inventors: Xiaoye Wu, Jiang Hsieh, Paavana Sainath, Dan Xu, Yannan Jim, Girijesh Kumar Yadava, Adam Israel Cohen, Hewei Gao
  • Publication number: 20140133719
    Abstract: A method is provided. The method includes acquiring projection data of an object from a plurality of pixels, reconstructing the acquired projection data from the plurality of pixels into a reconstructed image, performing material characterization and decomposition of an image volume of the reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. The method also includes generating a re-mapped image volume for at least one basis material of the two basis materials, and performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection. The method further includes generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials, wherein the multi-material corrected projections include linearized projections.
    Type: Application
    Filed: November 14, 2012
    Publication date: May 15, 2014
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Xiaoye Wu, Jiang Hsieh, Paavana Sainath, Dan Xu, Yannan Jin, Girijesh Kumar Yadava, Adam Israel Cohen, Hewei Gao