Patents by Inventor Girish S. Agarwal

Girish S. Agarwal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Omnidirectional antireflection coating
    Patent number: 7894137
    Abstract: An antireflective coating is disclosed having at least one layer of a first material with a first index of refraction and a first thickness, the first index of refraction and first thickness substantially conforming to a refractive index profile matching a reflectionless potential.
    Type: Grant
    Filed: April 24, 2007
    Date of Patent: February 22, 2011
    Assignees: The Board of Regents for Oklahoma State University, The University of Hyderabad
    Inventors: Subhasish Dutta Gupta, Girish S. Agarwal
  • OMNIDIRECTIONAL ANTIREFLECTION COATING
    Publication number: 20090323190
    Abstract: An antireflective coating is disclosed having at least one layer of a first material with a first index of refraction and a first thickness, the first index of refraction and first thickness substantially conforming to a refractive index profile matching a reflectionless potential.
    Type: Application
    Filed: April 24, 2007
    Publication date: December 31, 2009
    Inventors: S. Dutta Gupta, Girish S. Agarwal
  • SUB-WAVELENGTH IMAGING AND IRRADIATION WITH ENTANGLED PARTICLES
    Publication number: 20090189093
    Abstract: A method and apparatus for using one particle out of N particles for irradiating or investigating a target are provided. A radiation source with N incoherent emitters emits a radiation, and particles of said radiation are detected by using at least N?1 detectors located at N?1 different positions. A discriminator is adapted for identifying particle detection events on at least N?1 detectors within a predetermined time period from other particle detection events.
    Type: Application
    Filed: February 27, 2009
    Publication date: July 30, 2009
    Inventors: JOACHIM VON ZANTHIER, CHRISTOPH THIEL, ENRIQUE SOLANO, THIERRY BASTIN, GIRISH S. AGARWAL
  • Sub-wavelength imaging and irradiation with entangled particles
    Patent number: 7518127
    Abstract: A method and apparatus for using one particle out of N particles for irradiating or investigating a target are provided. A radiation source with N incoherent emitters emits a radiation, and particles of said radiation are detected by using at least N?1 detectors located at N?1 different positions. A discriminator is adapted for identifying particle detection events on at least N?1 detectors within a predetermined time period from other particle detection events.
    Type: Grant
    Filed: December 22, 2006
    Date of Patent: April 14, 2009
    Inventors: Joachim von Zanthier, Christoph Thiel, Enrique Solano, Thierry Bastin, Girish S. Agarwal
  • SUB-WAVELENGTH IMAGING AND IRRADIATION WITH ENTANGLED PARTICLES
    Publication number: 20080164426
    Abstract: A method and apparatus for using one particle out of N particles for irradiating or investigating a target are provided. A radiation source with N incoherent emitters emits a radiation, and particles of said radiation are detected by using at least N?1 detectors located at N?1 different positions. A discriminator is adapted for identifying particle detection events on at least N?1 detectors within a predetermined time period from other particle detection events.
    Type: Application
    Filed: December 22, 2006
    Publication date: July 10, 2008
    Inventors: Joachim Von Zanthier, Christoph Thiel, Enrique Solano, Thierry Bastin, Girish S. Agarwal