Abstract: An apparatus for selecting products on the basis of their composition via X-ray fluorescence spectroscopy includes an X-ray source that emits an X-ray beam towards a product sample, and a particle detector for receiving an X-ray beam diffused by the product sample and generating a signal received that can be analysed to determine a chemical composition of the product sample and selecting a type of product corresponding to said chemical composition of the product sample. The apparatus includes a first vacuum chamber located between an output of the apparatus facing the product sample and the X-ray source, and a second vacuum chamber located between the output of the apparatus facing the product sample and the detector. The apparatus also includes an optical module with polycapillary lens located downstream of the X-ray source, which is configured for focusing the X-ray beam and is associated in a vacuum-tight way to the first vacuum chamber.

Abstract: An apparatus (20) for carrying out a quality control on industrial production lines (10), comprising one or more apparatuses (30, 40, 50) for the measurement of properties of a product sample (C) of the aforesaid industrial production lines (10), which supply respective one or more measurement signals, the apparatus (20) comprising a processing module configured for processing the one or more measurement signals and obtaining properties of the product sample (C), the quality control being carried out as a function of said properties of the product sample (C), said one or more apparatuses (30, 40, 50) for the measurement of properties of a product sample (C) comprising: an x-ray fluorescence apparatus (30) that comprises an x-ray source (331), which emits a first x-ray beam (XB, XBC) towards the product sample (C) in a measurement environment, and a particle detector (335), which is configured for receiving a second x-ray beam (XBR) scattered by the product sample (C) and generating a first received signal sup

Abstract: An apparatus for selecting products on the basis of their composition via X-ray fluorescence spectroscopy comprises an X-ray source that emits an X-ray beam towards a product sample, and a particle detector for receiving an X-ray beam diffused by said product sample and generating a signal received that can be analysed to determine a chemical composition of said product sample and select a type of product corresponding to said chemical composition of the product sample. According to the invention, the aforesaid apparatus comprises a first vacuum chamber located between an output of the apparatus facing the product sample and said X-ray source, and a second vacuum chamber located between said output of the apparatus facing the product sample and said detector, said apparatus further comprising an optical module with polycapillary lens located downstream of said X-ray source, which is configured for focusing said X-ray beam and is moreover associated in a vacuum-tight way to said first vacuum chamber.