Abstract: In general, the invention facilitates improved inter-module communication within a medical device system, such as an automated external defibrillator (AED), by using a serial data interface based on the USB specification to transfer data between modules. As a result, data transmission rates may be improved significantly, thereby providing ample communication bandwidth for a variety of medical device applications. Further, the serial interconnect nature of the USB interface reduces the number of physical interconnects that are needed to support the interface, thereby reducing the design constraints on the medical device system.

Abstract: In general, the invention facilitates improved inter-module communication within a medical device system, such as an automated external defibrillator (AED), by using a serial data interface based on the USB specification to transfer data between modules. As a result, data transmission rates may be improved significantly, thereby providing ample communication bandwidth for a variety of medical device applications. Further, the serial interconnect nature of the USB interface reduces the number of physical interconnects that are needed to support the interface, thereby reducing the design constraints on the medical device system.

Abstract: A data analyzer for use in BIST circuitry has been provided. The data analyzer allows both comparison analysis and signature analysis to be performed on a circuit response data stream. The data analyzer includes a plurality of data registers which are serially-coupled and where each data register is capable of performing comparison analysis and signature analysis on one data bit of the circuit response data stream. This allows the circuit under test can be completely and thoroughly tested for faults.

Abstract: A built-in self test (BIST) circuit verifies the operation of a circuit under test in an integrated circuit. The BIST generates a series of test vectors with linear feedback shift register (LFSR) and applies the test vectors to the circuit under test. The output signal from the circuit under test in response to the test vectors is routed back and accumulating in a predetermined manner in the LFSR for providing a test signature. Thus, the same components in the LFSR generating the test vector also perform the accumulation of the test signature. The accumulating test signature may be used as a subsequent test vector.