Abstract: A chip stack comprising a flex circuit including a flex substrate having a first conductive pattern disposed thereon and a plurality of leads extending therefrom. Also included in the chip stack are at least two integrated circuit chip packages. The integrated circuit chip packages may be electrically connected to the first conductive pattern of the flex circuit such that the integrated circuit chip packages are positioned upon respective ones of opposed top and bottom surfaces of the flex substrate. Alternatively, one of the integrated circuit chip packages may be positioned upon the top surface of the flex substrate and electrically connected to the first conductive pattern, with the remaining integrated circuit chip package being attached in a non-conductive manner to the bottom surface of the flex substrate such that the conductive contacts of such integrated circuit chip package and the leads collectively define a composite footprint for the chip stack.

Abstract: A chip stack comprising a flex circuit including a flex substrate having a first conductive pattern disposed thereon and a plurality of leads extending therefrom. Also included in the chip stack are at least two integrated circuit chip packages. The integrated circuit chip packages may be electrically connected to the first conductive pattern of the flex circuit such that the integrated circuit chip packages are positioned upon respective ones of opposed top and bottom surfaces of the flex substrate. Alternatively, one of the integrated circuit chip packages may be positioned upon the top surface of the flex substrate and electrically connected to the first conductive pattern, with the remaining integrated circuit chip package being attached in a non-conductive manner to the bottom surface of the flex substrate such that the conductive contacts of such integrated circuit chip package and the leads collectively define a composite footprint for the chip stack.

Abstract: A chip stack comprising at least one base layer including a base substrate having a first conductive pattern disposed thereon. The chip stack further comprises at least one interconnect frame having a second conductive pattern disposed thereon which is electrically connected to the first conductive pattern of the base layer. Also included in the chip stack are at least two integrated circuit chip packages. The integrated circuit chip packages may each be electrically connected to the first conductive pattern of the base layer such that one of the integrated circuit chip packages is at least partially circumvented by the interconnect frame.

Abstract: The present invention provides a plurality of vertically stacked semiconductor dies which are electrically connected to each other. Each semiconductor die has leads which extend out from at least two opposed side surfaces of the semiconductor die. Each lead defines a first junction, a second junction, an inner width and an outer width. The second junctions of the leads of the upper semiconductor die are electrically connected to the first junctions of the leads of the lower semiconductor die. Additionally, the inner widths of the leads of the upper semiconductor die prior to electrically connecting the leads of the upper and lower semiconductor dies are less than the outer widths of the leads of the lower semiconductor die.

Abstract: The present invention provides a plurality of vertically stacked semiconductor dies which are electrically connected to each other. Each semiconductor die has leads which extend out from at least two opposed side surfaces of the semiconductor die. Each lead defines a first junction, a second junction, an inner width and an outer width. The second junctions of the leads of the upper semiconductor die are electrically connected to the first junctions of the leads of the lower semiconductor die. Additionally, the inner widths of the leads of the upper semiconductor die prior to electrically connecting the leads of the upper and lower semiconductor dies are less than the outer widths of the leads of the lower semiconductor die.

Abstract: A semiconductor die stack is provided which includes at least two semiconductor dies each having electrical leads. The leads of the upper semiconductor die are directly electrically connected to respective leads of the lower semiconductor die. Electrical connectivity is maintained throughout the semiconductor die stack. The electrical connection between respective leads of the upper and lower semiconductor die is made outside the footprint of the semiconductor die.

Abstract: A chip stack comprising at least one base layer including a base substrate having a first conductive pattern disposed thereon. The chip stack further comprises at least one interconnect frame having a second conductive pattern disposed thereon which is electrically connected to the first conductive pattern of the base layer. Also included in the chip stack are at least two integrated circuit chip packages. The integrated circuit chip packages may each be electrically connected to the first conductive pattern of the base layer such that one of the integrated circuit chip packages is at least partially circumvented by the interconnect frame.

Abstract: A chip stack comprising a flex circuit including a flex substrate having a first conductive pattern disposed thereon and a plurality of leads extending therefrom. Also included in the chip stack are at least two integrated circuit chip packages. The integrated circuit chip packages may be electrically connected to the first conductive pattern of the flex circuit such that the integrated circuit chip packages are positioned upon respective ones of opposed top and bottom surfaces of the flex substrate. Alternatively, one of the integrated circuit chip packages may be positioned upon the top surface of the flex substrate and electrically connected to the first conductive pattern, with the remaining integrated circuit chip package being attached in a non-conductive manner to the bottom surface of the flex substrate such that the conductive contacts of such integrated circuit chip package and the leads collectively define a composite footprint for the chip stack.

Abstract: A post in ring interconnect used for 3-D stacking. A retaining ring is formed on a pad on a bottom surface of a top PCB substrate to be stacked with a bottom PCB substrate. A post is formed on a pad on a top surface of the bottom PCB substrate. A conductive paste is applied on the pad on the bottom surface of the top PCB substrate and retained in a pocket partially defined by the retaining ring. The retaining ring is aligned with the post. By performing a compression step, a eutectic bond is formed between the top and bottom PCB substrates by the post and the conductive paste.

Abstract: A retaining ring interconnect. A retaining ring is formed on a perimeter of a pad on each of two adjoining surfaces of two PCB substrates. A conductive paste is applied between the pads on the two adjoining surfaces. The retaining rings are aligned and facing with each other. By performing a heat compression process, the retaining rings are connected to encompass the conductive paste. A eutectic bond is thus formed to bond the two PCB substrates.

Abstract: A chip stack comprising at least one base layer including a base substrate having a first conductive pattern disposed thereon. The chip stack further comprises at least one interconnect frame having a second conductive pattern disposed thereon which is electrically connected to the first conductive pattern of the base layer. Also included in the chip stack are at least two integrated circuit chip packages. The integrated circuit chip packages may each be electrically connected to the first conductive pattern of the base layer such that one of the integrated circuit chip packages is at least partially circumvented by the interconnect frame.

Abstract: A chip stack comprising at least two carrier layers, each of which includes a first conductive pattern disposed thereon. The chip stack further comprises at least one thermal ring having a second conductive pattern disposed thereon. The thermal ring is formed to include at least two flow channels. The thermal ring is disposed between the carrier layers, with the second conductive pattern being electrically connected to the first conductive pattern of each of the carrier layers. Also included in the chip stack are at least two integrated circuit chips which are electrically connected to respective ones of the first conductive patterns. One of the integrated circuit chips is circumvented by the thermal ring and disposed between the carrier layers. The flow channels within the thermal ring facilitate the circulation of cooling air over the integrated circuit chip disposed between the carrier layers.

Abstract: A retaining ring interconnect. A retaining ring is formed on a perimeter of a pad on each of two adjoining surfaces of two PCB substrates. A conductive paste is applied between the pads on the two adjoining surfaces. The retaining rings are aligned and facing with each other. By performing a heat compression process, the retaining rings are connected to encompass the conductive paste. A eutectic bond is thus formed to bond the two PCB substrates.

Abstract: A post in ring interconnect used for 3-D stacking. A retaining ring is formed on a pad on a bottom surface of a top PCB substrate to be stacked with a bottom PCB substrate. A post is formed on a pad on a top surface of the bottom PCB substrate. A conductive paste is applied on the pad on the bottom surface of the top PCB substrate and retained in a pocket partially defined by the retaining ring. The retaining ring is aligned with the post. By performing a compression step, a eutectic bond is formed between the top and bottom PCB substrates by the post and the conductive paste.

Abstract: A retaining ring interconnect. A retaining ring is formed on a perimeter of a pad on each of two adjoining surfaces of two PCB substrates. A conductive paste is applied between the pads on the two adjoining surfaces. The retaining rings are aligned and facing with each other. By performing a heat compression process, the retaining rings are connected to encompass the conductive paste. A eutectic bond is thus formed to bond the two PCB substrates.

Abstract: A post in ring interconnect used for 3-D stacking. A retaining ring is formed on a pad on a bottom surface of a top PCB substrate to be stacked with a bottom PCB substrate. A post is formed on a pad on a top surface of the bottom PCB substrate. A conductive paste is applied on the pad on the bottom surface of the top PCB substrate and retained in a pocket partially defined by the retaining ring. The retaining ring is aligned with the post. By performing a compression step, a eutectic bond is formed between the top and bottom PCB substrates by the post and the conductive paste.

Abstract: A chip stack comprising at least two chip packages. Each of the chip packages comprises a packaged chip including a body defining an opposed pair of sides and having a plurality of leads extending outwardly from each of the opposed sides thereof. Each chip package further comprises a pair of rails which extend along respective ones of the opposed sides of the body. Each of the rails defines opposed top and bottom surfaces and includes top inner and outer pads disposed on the top surface and bottom inner and outer pads disposed on the bottom surface. A plurality of conductive bumps are formed on respective ones of the top outer pads of each of the rails of one of the chip packages.

Abstract: A chip stack comprising at least two chip packages. Each of the chip packages comprises a packaged chip including a body defining an opposed pair of sides and having a plurality of leads extending outwardly from each of the opposed sides thereof. Each chip package further comprises a pair of rails which extend along respective ones of the opposed sides of the body. Each of the rails defines opposed top and bottom surfaces and includes top inner and outer pads disposed on the top surface and bottom inner and outer pads disposed on the bottom surface. The leads of the packaged chip within each chip package are electrically connected to respective ones of the top inner pads of each of the corresponding rails. In the chip stack, the chip packages are electrically connected to each other via the electrical connection of the leads of the packaged chip of one of the chip packages to respective ones of the bottom inner pads of the rails of the remaining one of the chip packages.

Abstract: A chip stack comprising at least one base layer including a base substrate having a first conductive pattern disposed thereon. The chip stack further comprises at least one interconnect frame having a second conductive pattern disposed thereon which is electrically connected to the first conductive pattern of the base layer. Also included in the chip stack are at least two integrated circuit chip packages. The integrated circuit chip packages may each be electrically connected to the first conductive pattern of the base layer such that one of the integrated circuit chip packages is at least partially circumvented by the interconnect frame.