Abstract: Systems, methods, and apparatus related to memory devices. In one approach, an artificial intelligence system uses a memory device to provide inference results. Image data from a camera is provided to the memory device. The memory device stores the image data received from the camera. The memory device includes dynamic random access memory (DRAM), and static random access memory (SRAM). The memory device also includes a processor to run a neural network. The neural network uses the image data as input. An output from the neural network provides an inference result. In one example, the memory device has a same form factor as a conventional DRAM device. The memory device includes a multiply-accumulate (MAC) engine that supports computations for the neural network.

Abstract: The invention provides a boundary scan test interface circuit. The boundary scan test interface circuit includes N test input pads, a test interfacing module and M test output pads, wherein N and M are positive integers, and M is smaller than N. The test interfacing module is coupled to the test input pads. The test interfacing module having a plurality of logical gates, and each of input pins of each of the logical gates coupled to each of the test input pads. The test output pads are coupled to output pins of the logical gates in the test interfacing module.

Abstract: The invention provides a boundary scan test interface circuit. The boundary scan test interface circuit includes N test input pads, a test interfacing module and M test output pads, wherein N and M are positive integers, and M is smaller than N. The test interfacing module is coupled to the test input pads. The test interfacing module having a plurality of logical gates, and each of input pins of each of the logical gates coupled to each of the test input pads. The test output pads are coupled to output pins of the logical gates in the test interfacing module.