Patents by Inventor Glenn Abram Newcomer

Glenn Abram Newcomer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Enhanced hybrid systems and methods for characterizing stress in chemically strengthened transparent substrates
    Patent number: 11852549
    Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source system optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements and enhanced configurations of the EPCS and LPS sub-systems to improve measurement accuracy are also disclosed.
    Type: Grant
    Filed: February 21, 2022
    Date of Patent: December 26, 2023
    Assignee: Corning Incorporated
    Inventors: Ryan Claude Andrews, David Matthew Berg, Pierre Michel Bouzi, William John Furnas, Jacob Immerman, Jeremiah Robert Jacobson, Katherine Anne Lindberg, Glenn Abram Newcomer, Evan Lewis Olson, Viktor Stepanov, Nathaniel David Wetmore
  • ENHANCED HYBRID SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY STRENGTHENED TRANSPARENT SUBSTRATES
    Publication number: 20220276106
    Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source system optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements and enhanced configurations of the EPCS and LPS sub-systems to improve measurement accuracy are also disclosed.
    Type: Application
    Filed: February 21, 2022
    Publication date: September 1, 2022
    Inventors: Ryan Claude Andrews, David Matthew Berg, Pierre Michel Bouzi, William John Furnas, Jacob Immerman, Jeremiah Robert Jacobson, Katherine Anne Lindberg, Glenn Abram Newcomer, Evan Lewis Olson, Viktor Stepanov, Nathaniel David Wetmore
  • Hybrid systems and methods for characterizing stress in chemically strengthened transparent substrates
    Patent number: 11105612
    Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements to improve measurement accuracy are also disclosed.
    Type: Grant
    Filed: March 20, 2020
    Date of Patent: August 31, 2021
    Assignee: Corning Incorporated
    Inventors: Ryan Claude Andrews, Pierre Michel Bouzi, William John Furnas, Jeremiah Robert Jacobson, Glenn Abram Newcomer, Evan Lewis Olson, Babak Robert Raj, Rostislav Vatchev Roussev, Viktor Stepanov, Nathaniel David Wetmore
  • HYBRID SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY STRENGTHENED TRANSPARENT SUBSTRATES
    Publication number: 20200300615
    Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements to improve measurement accuracy are also disclosed.
    Type: Application
    Filed: March 20, 2020
    Publication date: September 24, 2020
    Inventors: Ryan Claude Andrews, Pierre Michel Bouzi, William John Furnas, Jeremiah Robert Jacobson, Glenn Abram Newcomer, Evan Lewis Olson, Babak Robert Raj, Rostislav Vatchev Roussev, Viktor Stepanov, Nathaniel David Wetmore