Abstract: Circuit apparatus comprises an integral structure of first and second multilayer wiring board portions and a flexible circuit portion. The wiring board portions each have at least circuit trace planes, ground planes and insulator planes. The flexible circuit portion includes at least one signal trace plane and at least one ground plane separated by at least one insulator plane; the singal trace plane of the flexible circuit portion being integral with a signal trace plane of each of the wiring board portions, the ground plane of the flexible circuit portion being integral with a ground plane of each of the wiring board portions, and the insulator plane of the flexible circuit portion being integral with an insulator plane of each of the wiring board portions. Selected ones of a plurality of electric contacts are connected to selected ones of the circuit traces of the circuit trace plane of the flexible circuit portions; others of the contacts being connected to the ground plane.

Abstract: An apparatus for simultaneously testing multiple integrated circuits includes a sensing circuit associated with each of the tested circuits. Each sensing circuit includes a differential amplifier with its positive input connected to the input of the test circuit, and its inversion input connected to the test circuit output. The test circuit input and positive amplifier input are biased to a selected voltage, and the voltage drop across the test circuit is provided to the amplifier inversion input. Whenever the test circuit is open, intermittently open or highly resistive, the voltage drop across the test circuit exceeds the threshold voltage of the differential amplifier, causing the amplifier to generate a high level logic output representing an open circuit condition. The outputs of the various sensing circuits together form a digital word representative of the condition of all of the test circuits.