Abstract: A probe card fixture (20) precisely controls the movement of a probe card (44) relative to a circuit (30) to be tested. The fixture (20) includes a carriage (42) movable to and from the circuit by four lead screws (237) all simultaneously driven by a rigid drive link (300). The probe card (44) is mounted to the carriage (42) by mechanisms that provide for adjustment of the orientation of the probe card (44) to correspond to the orientation of the particular batch of circuits (30) to be tested. A programmable control system (350) controls the lead screw drive to minimize travel of the carriage (42), thereby increasing throughput.