Patents by Inventor Glenn Wikle

Glenn Wikle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200398550
    Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
    Type: Application
    Filed: June 29, 2020
    Publication date: December 24, 2020
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
  • Publication number: 20200290154
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Application
    Filed: March 26, 2020
    Publication date: September 17, 2020
    Applicant: Sigma Labs, Inc.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Patent number: 10717264
    Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
    Type: Grant
    Filed: December 27, 2018
    Date of Patent: July 21, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
  • Patent number: 10639745
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: May 5, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Publication number: 20200101671
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
    Type: Application
    Filed: September 18, 2019
    Publication date: April 2, 2020
    Applicant: Sigma Labs, Inc.
    Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro
  • Patent number: 10479020
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: November 19, 2019
    Assignee: SIGMA LABS, INC.
    Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro
  • Publication number: 20190255654
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Application
    Filed: February 21, 2019
    Publication date: August 22, 2019
    Applicant: Sigma Labs, Inc.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Publication number: 20190210353
    Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
    Type: Application
    Filed: December 27, 2018
    Publication date: July 11, 2019
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
  • Publication number: 20190134754
    Abstract: This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.
    Type: Application
    Filed: November 6, 2018
    Publication date: May 9, 2019
    Applicant: SIGMA LABS, INC.
    Inventors: Lars Jacquemetton, Vivek R. Dave, Mark J. Cola, Glenn Wikle, R. Bruce Madigan
  • Patent number: 10207489
    Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
    Type: Grant
    Filed: September 30, 2016
    Date of Patent: February 19, 2019
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
  • Publication number: 20190039318
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
    Type: Application
    Filed: August 1, 2018
    Publication date: February 7, 2019
    Applicant: Sigma Labs, Inc.
    Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro
  • Publication number: 20170090462
    Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
    Type: Application
    Filed: September 30, 2016
    Publication date: March 30, 2017
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Matias Roybal, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
  • Patent number: 5610832
    Abstract: Method and apparatus for providing multiple connection modes in a CAD tool or other computer program for integrated circuit design. The apparatus includes a graphical editor for entering and modifying, in memory, circuit elements of an integrated circuit layout. Within the apparatus is an implicit connection generator for automatically extracting electrical connections between the circuit elements in the layout, the generator representing the connections by connectivity data stored in a design database contained within memory. Also within the apparatus is an explicit wiring generator for creating and preserving electrical connections between the circuit elements in response to user commands from the editor. The explicit wiring generator represents the connections by connectivity data stored in the design database.
    Type: Grant
    Filed: November 22, 1994
    Date of Patent: March 11, 1997
    Assignee: Mentor Graphics Corporation
    Inventors: Glenn Wikle, Suresh Ramaswamy, Thomas G. Matheson
  • Patent number: 5592392
    Abstract: Method and apparatus for design integrated circuit layouts with extensible elements. The elements are generated by extensible element programs the first time the element is selected for a design, with the results stored in a run time cache. Element entries in the cache are accessible through a hash table, with each element reference hashed to provide a hash handle to the table. Subsequent hashes of an element reference provide access to the cache so that the same extensible element need not be regenerated by the element program each time the element is selected. To reduce the cache size, only the attributes of an element derived from the defining attributes of an element are cached. Other attributes such as location and orientation are stored with the element reference as part of a circuit design in a design database. In this way, related but different elements may use the same cache entry, with the differences then added once the cache entry is retrieved.
    Type: Grant
    Filed: November 22, 1994
    Date of Patent: January 7, 1997
    Assignee: Mentor Graphics Corporation
    Inventors: Thomas G. Matheson, Joseph F. Cicchiello, Glenn Wikle