Patents by Inventor Gnowei Zhang

Gnowei Zhang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7881424
    Abstract: A method for calibrating a dual-energy CT system and an image reconstruction method are disclosed to calculate images of atomic number and density of a scanned object as well as its attenuation coefficient images at any energy level. The present invention removes the effect from a cupping artifact due to X-ray beam hardening. The method for calibrating a dual-energy CT system is provided comprising steps of selecting at least two different materials, detecting penetrative rays from dual-energy rays penetrating said at least two different materials under different combinations of thickness to acquire projection values, and creating a lookup table in a form of correspondence between said different combinations of thickness and said projection values.
    Type: Grant
    Filed: March 11, 2008
    Date of Patent: February 1, 2011
    Assignees: Tsinghua University, Nuctech Company Limited
    Inventors: Li Zhang, Zhiqiang Chen, Gnowei Zhang, Jianping Cheng, Yuanjing Li, Yinong Liu, Yuxiang Xing, Ziran Zhao, Yongshun Xiao