Patents by Inventor Goichi Ono

Goichi Ono has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050088059
    Abstract: There is provided a generator generating power from vibration, capable of increasing a power generation voltage even if the vibration is small in amplitude to thereby enhance efficiency of power generation. A vibration power generator, provided with a mechanism for converting vibrational energy into electrical energy, comprises a switch for switching over whether or not power is outputted, and control of the switch is executed by periodic control thereof such that switchover occurs between respective time periods for outputting the power and respective time periods for not outputting the power at cycles not less than twice and not more than 100 times cycles of vibration. With the invention, efficiency of the generator can be enhanced, and it is possible to provide electronic equipment without power supply from outside, and capable of saving trouble of battery replacement.
    Type: Application
    Filed: June 29, 2004
    Publication date: April 28, 2005
    Inventors: Norio Ohkubo, Masayuki Miyazaki, Hidetoshi Tanaka, Goichi Ono
  • Patent number: 6867637
    Abstract: In a semiconductor integrated circuit device, for realizing high speed, as well as superior product yield rate and usability, while reducing circuit scale and improving on product yield rate and reliability thereof, a main circuit, constructed with CMOS elements, is coupled to a speed monitor circuit for forming a speed signal corresponding to an operating speed thereof and to a substrate bias controller for supplying corresponding substrate bias voltages to the main circuit in response to the speed monitor circuit. A current limiting circuit is also provided in conjunction with the substrate bias controller to prevent an overflow of current due to bias voltage.
    Type: Grant
    Filed: July 13, 2004
    Date of Patent: March 15, 2005
    Assignee: Renesas Technology Corp.
    Inventors: Masayuki Miyazaki, Koichiro Ishibashi, Goichi Ono
  • Patent number: 6847252
    Abstract: A semiconductor integrated circuit device having a mechanism of compensating not only circuit operational speed but also variations in leakage current, which includes: a main circuit constructed with CMOS device, a delay monitor for simulating a critical path of the main circuit constructed by a CMOS and monitoring a delay of the path, a PN Vt balance compensation circuit for detecting a threshold voltage difference between a PMOS transistor and an NMOS transistor, and a well bias generating circuit for receiving outputs of the delay monitor and the PN Vt balance compensation circuit and applying a well bias to the delay monitor and the main circuit so as to compensate the operation speed of the delay monitor to a desired speed and reduce a threshold voltage difference between the PMOS and NMOS transistors.
    Type: Grant
    Filed: September 29, 2003
    Date of Patent: January 25, 2005
    Assignee: Renesas Technology Corporation
    Inventors: Goichi Ono, Masayuki Miyazaki, Koichiro Ishibashi
  • Patent number: 6833750
    Abstract: A semiconductor integrated circuit and power control method use one of a supply voltage of the circuit and a delay time of the circuit to control a substrate bias voltage applied to a substrate of an insulated gate field effect transistor. High speed operation, consuming a small amount of power, is achieved. A CMOS circuit has a widened operating voltage range, with reduced leak currents in a standby mode in a range of high supply voltage, reducing power consumption of the CMOS circuit, and increasing operating speed of the CMOS circuit in the range of low supply voltage.
    Type: Grant
    Filed: December 18, 2002
    Date of Patent: December 21, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Masayuki Miyazaki, Goichi Ono, Koichiro Ishibashi
  • Publication number: 20040251484
    Abstract: In a semiconductor integrated circuit device, for realizing high speed, as well as superior product yield rate and usability, while reducing circuit scale and improving on product yield rate and reliability thereof, a main circuit, constructed with CMOS elements, is coupled to a speed monitor circuit for forming a speed signal corresponding to an operating speed thereof and to a substrate bias controller for supplying corresponding substrate bias voltages to the main circuit in response to the speed monitor circuit. A current limiting circuit is also provided in conjunction with the substrate bias controller to prevent an overflow of current due to bias voltage.
    Type: Application
    Filed: July 13, 2004
    Publication date: December 16, 2004
    Inventors: Masayuki Miyazaki, Koichiro Ishibashi, Goichi Ono
  • Patent number: 6778002
    Abstract: In a semiconductor integrated circuit device, for realizing high speed, as well as superior product yield rate and usability, while reducing circuit scale and improving on product yield rate and reliability thereof, a main circuit, constructed with CMOS elements, is coupled to a speed monitor circuit for forming a speed signal corresponding to an operating speed thereof and to a substrate bias controller for supplying corresponding substrate bias voltages to the main circuit in response to the speed monitor circuit. A current limiting circuit is also provided in conjunction with the substrate bias controller to prevent an overflow of current due to bias voltage.
    Type: Grant
    Filed: July 31, 2002
    Date of Patent: August 17, 2004
    Assignee: Renesas Technology Corp.
    Inventors: Masayuki Miyazaki, Koichiro Ishibashi, Goichi Ono
  • Publication number: 20040016977
    Abstract: A body bias control system allows for independent design of a functional module, thereby reducing the burden of designing the module. The body bias control system provides a switch circuit having an area in which the body bias is controlled independently of its outside portion, for controlling the supply of body bias in the vicinity of the area. Preferably three types of switches are provided for switching the body bias to suitable levels for a standby mode, a mode of normal operation and a mode of high-speed operation.
    Type: Application
    Filed: May 6, 2003
    Publication date: January 29, 2004
    Applicants: Hitachi, Ltd., Hitachi ULSI Systems Co., Ltd.
    Inventors: Masayuki Miyazaki, Yusuke Kanno, Goichi Ono, Toshinobu Shinbo, Yoshihiko Yasu, Kazumasa Yanagisawa, Takashi Kuraishi
  • Patent number: 6653890
    Abstract: Disclosed is a semiconductor integrated circuit device having a control mechanism 11 for compensating not only circuit operational speed but also variations in leakage current, which includes: a main circuit 10 constructed by a CMOS; a delay monitor 21 for simulating a critical path of the main circuit 10 constructed by a CMOS and monitoring a delay of the path; a PN Vt balance compensation circuit 23 for detecting a threshold voltage difference between a PMOS transistor and an NMOS transistor; and a well bias generating circuit 25 for receiving outputs of the delay monitor 21 and the PN Vt balance compensation circuit 23 and applying a well bias to the delay monitor 21 and the main circuit 10 so as to compensate the operation speed of the delay monitor 21 to a desired speed and reduce a threshold voltage difference between the PMOS and NMOS transistors.
    Type: Grant
    Filed: October 31, 2002
    Date of Patent: November 25, 2003
    Assignee: Renesas Technology Corporation
    Inventors: Goichi Ono, Masayuki Miyazaki, Koichiro Ishibashi
  • Publication number: 20030085751
    Abstract: In a semiconductor integrated circuit device comprising a CMOS circuit, the CMOS circuit operating at a high speed, consuming a small amount of power, is achieved. In particular, acceleration of the operating speed under low voltage is achieved.
    Type: Application
    Filed: December 18, 2002
    Publication date: May 8, 2003
    Applicant: Hitachi, Ltd.
    Inventors: Masayuki Miyazaki, Goichi Ono, Koichiro Ishibashi
  • Publication number: 20030080802
    Abstract: Disclosed is a semiconductor integrated circuit device having a mechanism of compensating not only circuit operational speed but also variations in leakage current, which includes: a main circuit constructed by a CMOS; a delay monitor 11 for simulating a critical path of the main circuit constructed by a CMOS and monitoring a delay of the path; a PN Vt balance compensation circuit 13 for detecting a threshold voltage difference between a PMOS transistor and an NMOS transistor; and a well bias generating circuit 25 for receiving outputs of the delay monitor 11 and the PN Vt balance compensation circuit 15 and applying a well bias to the delay monitor 11 and the main circuit so as to compensate the operation speed of the delay monitor 11 to a desired speed and reduce a threshold voltage difference between the PMOS and NMOS transistors.
    Type: Application
    Filed: October 31, 2002
    Publication date: May 1, 2003
    Applicant: Hitachi, Ltd.
    Inventors: Goichi Ono, Masayuki Miyazaki, Koichiro Ishibashi
  • Patent number: 6518825
    Abstract: In a semiconductor integrated circuit device comprising a CMOS circuit, the CMOS circuit operating at a high speed, consuming a small amount of power, is achieved. In particular, acceleration of the operating speed under low voltage is achieved. The semiconductor integrated circuit device of the invention comprises a main circuit including a CMOS circuit, a changeover circuit, a substrate bias control circuit and a switching circuit and, in accordance with a changing signal from the changeover circuit, switches states of a substrate of a MOS transistor of the main circuit between a state in which normal supply voltage as well as ground voltage are applied and a state in which forward bias is applied. The changeover circuit detects a drop in supply voltage, etc. and outputs changing signals.
    Type: Grant
    Filed: May 24, 2001
    Date of Patent: February 11, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Masayuki Miyazaki, Goichi Ono, Koichiro Ishibashi
  • Publication number: 20020186071
    Abstract: In a semiconductor integrated circuit device, for realizing high speed, as well as superior product yield rate and usability, while reducing circuit scale and improving on product yield rate and reliability thereof, a main circuit, constructed with CMOS elements, is coupled to a speed monitor circuit for forming a speed signal corresponding to an operating speed thereof and to a substrate bias controller for supplying corresponding substrate bias voltages to the main circuit in response to the speed monitor circuit. A current limiting circuit is also provided in conjunction with the substrate bias controller to prevent an overflow of current due to bias voltage.
    Type: Application
    Filed: July 31, 2002
    Publication date: December 12, 2002
    Inventors: Masayuki Miyazaki, Koichiro Ishibashi, Goichi Ono
  • Patent number: 6466077
    Abstract: In a semiconductor integrated circuit device, for realizing high speed, as well as superior product yield rate and usability, while reducing circuit scale and improving on product yield rate and reliability thereof, a main circuit, constructed with CMOS elements, is coupled to a speed monitor circuit for forming a speed signal corresponding to an operating speed thereof and to a substrate bias controller for supplying corresponding substrate bias voltages to the main circuit in response to the speed monitor circuit.
    Type: Grant
    Filed: September 13, 2000
    Date of Patent: October 15, 2002
    Assignee: Hitachi, Ltd.
    Inventors: Masayuki Miyazaki, Koichiro Ishibashi, Goichi Ono
  • Publication number: 20010046156
    Abstract: In a semiconductor integrated circuit device comprising a CMOS circuit, the CMOS circuit operating at a high speed, consuming a small amount of power, is achieved. In particular, acceleration of the operating speed under low voltage is achieved.
    Type: Application
    Filed: May 24, 2001
    Publication date: November 29, 2001
    Inventors: Masayuki Miyazaki, Goichi Ono, Koichiro Ishibashi