Abstract: A die having multiple sets of contact pads, with each such set having two or more contact pads distributed over the die and electrically interconnected using a respective electrical intra-die path to enable die reuse in a manner that causes electrical inter-die buses to be relatively short in length. Each electrical intra-die path can optionally include one or more respective buffer circuits configured to reduce degradation of the various signals that are being shared by the reused dies. In some embodiments, multiple reused dies can be arranged in a linear or two-dimensional array on an interposer or on the package substrate and packaged together with one or more non-reused dies in a single integrated-circuit package.