Patents by Inventor Gook-tae Son

Gook-tae Son has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of measuring the probability of failure caused only by defects, method of measuring defect limited yield, and system using the same
    Patent number: 6985830
    Abstract: A method of calculating a probability of failures caused only by defects, a method of calculating a defect limited yield using the classification of pattern parameters extracted only from the defects, and a system for calculating the probability of failure and the defect limited yield are provided. In one exemplary embodiment for calculating a probability of failures caused only by defects, defects are detected in inspected blocks that have defects and in blocks located around the inspected blocks to measure the number of inspected blocks that have failures caused by reasons other than the defects in the blocks located around the inspected blocks having defects (n1), the number of inspected blocks having no failures in the blocks located around the inspected blocks having the defects (n2), the number of inspected blocks having failures caused by defects in the inspected blocks having defects (n3), and the number of inspected blocks having no failures in the inspected blocks having defects (n4).
    Type: Grant
    Filed: November 6, 2002
    Date of Patent: January 10, 2006
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Dae-sung Lee, Jae-cheol Lee, Gook-tae Son, Jung-hee Kim
  • Method of measuring the probability of failure caused only by defects, method of measuring defect limited yield, and system using the same
    Publication number: 20030120459
    Abstract: A method of calculating a probability of failures caused only by defects, a method of calculating a defect limited yield using the classification of pattern parameters extracted only from the defects, and a system for calculating the probability of failure and the defect limited yield are provided. In one exemplary embodiment for calculating a probability of failures caused only by defects, defects are detected in inspected blocks that have defects and in blocks located around the inspected blocks to measure the number of inspected blocks that have failures caused by reasons other than the defects in the blocks located around the inspected blocks having defects (n1), the number of inspected blocks having no failures in the blocks located around the inspected blocks having the defects (n2), the number of inspected blocks having failures caused by defects in the inspected blocks having defects (n3), and the number of inspected blocks having no failures in the inspected blocks having defects (n4).
    Type: Application
    Filed: November 6, 2002
    Publication date: June 26, 2003
    Inventors: Dae-sung Lee, Jae-Cheol Lee, Gook-Tae Son, Jung-Hee Kim