Patents by Inventor Gopal Avinash

Gopal Avinash has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200097773
    Abstract: Methods and apparatus to automatically generate an image quality metric for an image are provided. An example method includes automatically processing a first medical image using a deployed learning network model to generate an image quality metric for the first medical image, the deployed learning network model generated from a digital learning and improvement factory including a training network, wherein the training network is tuned using a set of labeled reference medical images of a plurality of image types, and wherein a label associated with each of the labeled reference medical images indicates a central tendency metric associated with image quality of the image. The example method includes computing the image quality metric associated with the first medical image using the deployed learning network model by leveraging labels and associated central tendency metrics to determine the associated image quality metric for the first medical image.
    Type: Application
    Filed: November 27, 2019
    Publication date: March 26, 2020
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey, Xin Wang, Zhye Yin, Bruno DeMan
  • Patent number: 10565477
    Abstract: Methods and apparatus to automatically generate an image quality metric for an image are provided. An example method includes automatically processing a first medical image using a deployed learning network model to generate an image quality metric for the first medical image, the deployed learning network model generated from a digital learning and improvement factory including a training network, wherein the training network is tuned using a set of labeled reference medical images of a plurality of image types, and wherein a label associated with each of the labeled reference medical images indicates a central tendency metric associated with image quality of the image. The example method includes computing the image quality metric associated with the first medical image using the deployed learning network model by leveraging labels and associated central tendency metrics to determine the associated image quality metric for the first medical image.
    Type: Grant
    Filed: July 15, 2019
    Date of Patent: February 18, 2020
    Assignee: General Electric Company
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey, Xin Wang, Zhye Yin, Bruno De Man
  • Publication number: 20200012895
    Abstract: Systems and techniques for classification and localization based on annotation information are presented. In one example, a system trains a convolutional neural network based on training data and a plurality of images. The training data is associated with a plurality of patients from at least one imaging device. The plurality of images is associated with a plurality of masks from a plurality of objects. The convolutional neural network comprises a decoder consisting of at least one up-sampling layer and at least one convolutional layer. The system also generates a loss function based on the plurality of masks, where the loss function is iteratively back propagated to tune parameters of the convolutional neural network. The system also predicts a classification label for an input image based on the convolutional neural network.
    Type: Application
    Filed: July 26, 2018
    Publication date: January 9, 2020
    Inventors: Qian Zhao, Min Zhang, Gopal Avinash
  • Publication number: 20200012904
    Abstract: Systems and techniques for classification based on annotation information are presented. In one example, a system trains a convolutional neural network based on training data and a plurality of images. The plurality of images is associated with a plurality of masks, a plurality of image level labels, and/or a bounding box. The system also generates a first loss function based on the plurality of masks, a second loss function based on the plurality of image level labels, and a third loss function based on the bounding box. Furthermore, the system generates a fourth loss function based on the first loss function, the second loss function and the third loss function, where the fourth loss function is iteratively back propagated to tune parameters of the convolutional neural network. The system also predicts a classification label for an input image based on the convolutional neural network.
    Type: Application
    Filed: September 27, 2018
    Publication date: January 9, 2020
    Inventors: Qian Zhao, Min Zhang, Gopal Avinash
  • Publication number: 20200012884
    Abstract: Systems and techniques for classification based on annotation information are presented. In one example, a system trains a convolutional neural network based on training data and a plurality of images. The training data is associated with a plurality of patients from at least one imaging device. The plurality of images is associated with a plurality of masks from a plurality of objects. The system also generates a first loss function based on the plurality of masks, a second loss function based on a plurality of image level labels associated with the plurality of images, and a third loss function based on the first loss function and the second loss function, where the third loss function is iteratively back propagated to tune parameters of the convolutional neural network. The system also predicts a classification label for an input image based on the convolutional neural network.
    Type: Application
    Filed: August 3, 2018
    Publication date: January 9, 2020
    Inventors: Qian Zhao, Min Zhang, Gopal Avinash
  • Publication number: 20200012898
    Abstract: Systems and techniques for classification based on annotation information are presented. In one example, a system trains a convolutional neural network based on training data and a plurality of images. The training data is associated with a plurality of patients from at least one imaging device. The plurality of images is associated with a plurality of masks from a plurality of objects. The system also generates a loss function based on the plurality of masks, where the loss function is iteratively back propagated to tune parameters of the convolutional neural network. The system also predicts a classification label for an input image based on the convolutional neural network.
    Type: Application
    Filed: August 8, 2018
    Publication date: January 9, 2020
    Inventors: Qian Zhao, Min Zhang, Gopal Avinash
  • Publication number: 20190340470
    Abstract: Methods and apparatus to automatically generate an image quality metric for an image are provided. An example method includes automatically processing a first medical image using a deployed learning network model to generate an image quality metric for the first medical image, the deployed learning network model generated from a digital learning and improvement factory including a training network, wherein the training network is tuned using a set of labeled reference medical images of a plurality of image types, and wherein a label associated with each of the labeled reference medical images indicates a central tendency metric associated with image quality of the image. The example method includes computing the image quality metric associated with the first medical image using the deployed learning network model by leveraging labels and associated central tendency metrics to determine the associated image quality metric for the first medical image.
    Type: Application
    Filed: July 15, 2019
    Publication date: November 7, 2019
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey, Xin Wang, Zhye Yin, Bruno De Man
  • Patent number: 10438354
    Abstract: Methods and apparatus for monitoring and improving imaging system operation are provided. An example apparatus includes a first deployed deep learning network (DLN) which operates with an acquisition engine to generate an imaging device configuration. The example apparatus includes a second deployed DLN which operates with a reconstruction engine based on acquired image data. The example apparatus includes a first assessment engine with a third deployed DLN. The assessment engine receives output from at least one of the acquisition engine or the reconstruction engine to assess operation of the respective at least one of the acquisition engine or the reconstruction engine and to provide feedback to the respective at least one of the acquisition engine or the reconstruction engine. The first deployed DLN and the second deployed DLN are generated and deployed from first and second training DLNS, respectively.
    Type: Grant
    Filed: March 20, 2019
    Date of Patent: October 8, 2019
    Assignee: General Electric Company
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey
  • Publication number: 20190220975
    Abstract: Methods and apparatus for monitoring and improving imaging system operation are provided. An example apparatus includes a first deployed deep learning network (DLN) which operates with an acquisition engine to generate an imaging device configuration. The example apparatus includes a second deployed DLN which operates with a reconstruction engine based on acquired image data. The example apparatus includes a first assessment engine with a third deployed DLN. The assessment engine receives output from at least one of the acquisition engine or the reconstruction engine to assess operation of the respective at least one of the acquisition engine or the reconstruction engine and to provide feedback to the respective at least one of the acquisition engine or the reconstruction engine. The first deployed DLN and the second deployed DLN are generated and deployed from first and second training DLNS, respectively.
    Type: Application
    Filed: March 20, 2019
    Publication date: July 18, 2019
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey
  • Patent number: 10354171
    Abstract: Methods and apparatus to automatically generate an image quality metric for an image are provided. An example method includes automatically processing a first medical image using a deployed learning network model to generate an image quality metric for the first medical image, the deployed learning network model generated from a digital learning and improvement factory including a training network, wherein the training network is tuned using a set of labeled reference medical images of a plurality of image types, and wherein a label associated with each of the labeled reference medical images indicates a central tendency metric associated with image quality of the image. The example method includes computing the image quality metric associated with the first medical image using the deployed learning network model by leveraging labels and associated central tendency metrics to determine the associated image quality metric for the first medical image.
    Type: Grant
    Filed: September 10, 2018
    Date of Patent: July 16, 2019
    Assignee: General Electric Company
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey, Xin Wang, Zhye Yin, Bruno De Man
  • Patent number: 10242443
    Abstract: Methods and apparatus for monitoring and improving imaging system operation are provided. An example apparatus includes a first deployed deep learning network (DLN) which operates with an acquisition engine to generate an imaging device configuration. The example apparatus includes a second deployed DLN which operates with a reconstruction engine based on acquired image data. The example apparatus includes a first assessment engine with a third deployed DLN. The assessment engine receives output from at least one of the acquisition engine or the reconstruction engine to assess operation of the respective at least one of the acquisition engine or the reconstruction engine and to provide feedback to the respective at least one of the acquisition engine or the reconstruction engine. The first deployed DLN and the second deployed DLN are generated and deployed from first and second training DLNS, respectively.
    Type: Grant
    Filed: November 23, 2016
    Date of Patent: March 26, 2019
    Assignee: General Electric Company
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey
  • Publication number: 20190050987
    Abstract: Methods and apparatus for improved deep learning for image acquisition are provided. An imaging system configuration apparatus includes a training learning device including a first processor to implement a first deep learning network (DLN) to learn a first set of imaging system configuration parameters based on a first set of inputs from a plurality of prior image acquisitions to configure at least one imaging system for image acquisition, the training learning device to receive and process feedback including operational data from the plurality of image acquisitions by the at least one imaging system. The example apparatus includes a deployed learning device including a second processor to implement a second DLN, the second DLN generated from the first DLN of the training learning device, the deployed learning device configured to provide a second imaging system configuration parameter to the imaging system in response to receiving a second input for image acquisition.
    Type: Application
    Filed: October 9, 2018
    Publication date: February 14, 2019
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey
  • Publication number: 20190026608
    Abstract: Methods and apparatus to automatically generate an image quality metric for an image are provided. An example method includes automatically processing a first medical image using a deployed learning network model to generate an image quality metric for the first medical image, the deployed learning network model generated from a digital learning and improvement factory including a training network, wherein the training network is tuned using a set of labeled reference medical images of a plurality of image types, and wherein a label associated with each of the labeled reference medical images indicates a central tendency metric associated with image quality of the image. The example method includes computing the image quality metric associated with the first medical image using the deployed learning network model by leveraging labels and associated central tendency metrics to determine the associated image quality metric for the first medical image.
    Type: Application
    Filed: September 10, 2018
    Publication date: January 24, 2019
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey, Xin Wang, Zhye Yin, Bruno De Man
  • Patent number: 10127659
    Abstract: Methods and apparatus for improved deep learning for image acquisition are provided. An imaging system configuration apparatus includes a training learning device including a first processor to implement a first deep learning network (DLN) to learn a first set of imaging system configuration parameters based on a first set of inputs from a plurality of prior image acquisitions to configure at least one imaging system for image acquisition, the training learning device to receive and process feedback including operational data from the plurality of image acquisitions by the at least one imaging system. The example apparatus includes a deployed learning device including a second processor to implement a second DLN, the second DLN generated from the first DLN of the training learning device, the deployed learning device configured to provide a second imaging system configuration parameter to the imaging system in response to receiving a second input for image acquisition.
    Type: Grant
    Filed: November 23, 2016
    Date of Patent: November 13, 2018
    Assignee: General Electric Company
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey
  • Patent number: 10074038
    Abstract: Methods and apparatus to automatically generate an image quality metric for an image are provided. An example method includes automatically processing a first medical image using a deployed learning network model to generate an image quality metric for the first medical image, the deployed learning network model generated from a digital learning and improvement factory including a training network, wherein the training network is tuned using a set of labeled reference medical images of a plurality of image types, and wherein a label associated with each of the labeled reference medical images indicates a central tendency metric associated with image quality of the image. The example method includes computing the image quality metric associated with the first medical image using the deployed learning network model by leveraging labels and associated central tendency metrics to determine the associated image quality metric for the first medical image.
    Type: Grant
    Filed: November 23, 2016
    Date of Patent: September 11, 2018
    Assignee: General Electric Company
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey, Xin Wang, Zhye Yin, Bruno De Man
  • Publication number: 20180144214
    Abstract: Methods and apparatus to automatically generate an image quality metric for an image are provided. An example method includes automatically processing a first medical image using a deployed learning network model to generate an image quality metric for the first medical image, the deployed learning network model generated from a digital learning and improvement factory including a training network, wherein the training network is tuned using a set of labeled reference medical images of a plurality of image types, and wherein a label associated with each of the labeled reference medical images indicates a central tendency metric associated with image quality of the image. The example method includes computing the image quality metric associated with the first medical image using the deployed learning network model by leveraging labels and associated central tendency metrics to determine the associated image quality metric for the first medical image.
    Type: Application
    Filed: November 23, 2016
    Publication date: May 24, 2018
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey, Xin Wang, Zhye Yin, Bruno De Man
  • Publication number: 20180144243
    Abstract: Methods and apparatus for deep learning-based system design improvement are provided. An example system design engine apparatus includes a deep learning network (DLN) model associated with each component of a target system to be emulated, each DLN model to be trained using known input and known output, wherein the known input and known output simulate input and output of the associated component of the target system, and wherein each DLN model is connected as each associated component to be emulated is connected in the target system to form a digital model of the target system. The example apparatus also includes a model processor to simulate behavior of the target system and/or each component of the target system to be emulated using the digital model to generate a recommendation regarding a configuration of a component of the target system and/or a structure of the component of the target system.
    Type: Application
    Filed: November 23, 2016
    Publication date: May 24, 2018
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey
  • Publication number: 20180144466
    Abstract: Methods and apparatus for improved deep learning for image acquisition are provided. An imaging system configuration apparatus includes a training learning device including a first processor to implement a first deep learning network (DLN) to learn a first set of imaging system configuration parameters based on a first set of inputs from a plurality of prior image acquisitions to configure at least one imaging system for image acquisition, the training learning device to receive and process feedback including operational data from the plurality of image acquisitions by the at least one imaging system. The example apparatus includes a deployed learning device including a second processor to implement a second DLN, the second DLN generated from the first DLN of the training learning device, the deployed learning device configured to provide a second imaging system configuration parameter to the imaging system in response to receiving a second input for image acquisition.
    Type: Application
    Filed: November 23, 2016
    Publication date: May 24, 2018
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey
  • Publication number: 20180144465
    Abstract: Methods and apparatus for monitoring and improving imaging system operation are provided. An example apparatus includes a first deployed deep learning network (DLN) which operates with an acquisition engine to generate an imaging device configuration. The example apparatus includes a second deployed DLN which operates with a reconstruction engine based on acquired image data. The example apparatus includes a first assessment engine with a third deployed DLN. The assessment engine receives output from at least one of the acquisition engine or the reconstruction engine to assess operation of the respective at least one of the acquisition engine or the reconstruction engine and to provide feedback to the respective at least one of the acquisition engine or the reconstruction engine. The first deployed DLN and the second deployed DLN are generated and deployed from first and second training DLNS, respectively.
    Type: Application
    Filed: November 23, 2016
    Publication date: May 24, 2018
    Inventors: Jiang Hsieh, Gopal Avinash, Saad Sirohey
  • Patent number: 9008394
    Abstract: Methods and apparatus for determining brain cortical thickness are provided. One method includes determining an intensity profile at each of a plurality of cortical surface points of an imaged brain using brain tissue image data and calculating a cortical thickness based on a parametrically determined transition point of each intensity profile.
    Type: Grant
    Filed: November 26, 2008
    Date of Patent: April 14, 2015
    Assignees: General Electric Company, University of Washington
    Inventors: Zhongmin Steve Lin, Gopal Avinash, Saad Sirohey, Ananth Mohan, Satoshi Minoshima