Patents by Inventor Gordon A. Perrett

Gordon A. Perrett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11085759
    Abstract: A method of calibrating a laser measurement device includes positioning a calibration part, having known geometric specifications, at varying distances from the laser measurement device (within a measurement depth-of-field of the laser measurement device). The detected geometric specifications, measured at these different positions, are compared with the known specification(s) of the calibration part in order to improve the accuracy of the calibration. A calibration standoff fixture having a plurality of adjustable legs may be used in conjunction with the method to facilitate changing the position of the calibration part relative to the laser measurement device.
    Type: Grant
    Filed: September 25, 2020
    Date of Patent: August 10, 2021
    Assignee: Raytheon Technologies Corporation
    Inventor: Gordon A. Perrett
  • Publication number: 20210010804
    Abstract: A method of calibrating a laser measurement device includes positioning a calibration part, having known geometric specifications, at varying distances from the laser measurement device (within a measurement depth-of-field of the laser measurement device). The detected geometric specifications, measured at these different positions, are compared with the known specification(s) of the calibration part in order to improve the accuracy of the calibration. A calibration standoff fixture having a plurality of adjustable legs may be used in conjunction with the method to facilitate changing the position of the calibration part relative to the laser measurement device.
    Type: Application
    Filed: September 25, 2020
    Publication date: January 14, 2021
    Applicant: RAYTHEON TECHNOLOGIES CORPORATION
    Inventor: Gordon A. Perrett
  • Patent number: 10845189
    Abstract: A method of calibrating a laser measurement device includes positioning a calibration part, having known geometric specifications, at varying distances from the laser measurement device (within a measurement depth-of-field of the laser measurement device). The detected geometric specifications, measured at these different positions, are compared with the known specification(s) of the calibration part in order to improve the accuracy of the calibration. A calibration standoff fixture having a plurality of adjustable legs may be used in conjunction with the method to facilitate changing the position of the calibration part relative to the laser measurement device.
    Type: Grant
    Filed: March 27, 2019
    Date of Patent: November 24, 2020
    Assignee: Raythoen Technologies Corporation
    Inventor: Gordon A. Perrett
  • Publication number: 20200309513
    Abstract: A method of calibrating a laser measurement device includes positioning a calibration part, having known geometric specifications, at varying distances from the laser measurement device (within a measurement depth-of-field of the laser measurement device). The detected geometric specifications, measured at these different positions, are compared with the known specification(s) of the calibration part in order to improve the accuracy of the calibration. A calibration standoff fixture having a plurality of adjustable legs may be used in conjunction with the method to facilitate changing the position of the calibration part relative to the laser measurement device.
    Type: Application
    Filed: March 27, 2019
    Publication date: October 1, 2020
    Applicant: UNITED TECHNOLOGIES CORPORATION
    Inventor: Gordon A. Perrett
  • Patent number: 10690491
    Abstract: A method of inspecting a part includes manufacturing a standoff fixture specific to the part, coupling the standoff fixture to a laser measurement device, engaging the standoff fixture with the part, and actuating the laser measurement device to detect a geometric specification of a feature of the part, according to various embodiments. The standoff fixture may include an attachment portion configured to be coupled to the laser measurement device and a plurality of legs extending from the attachment portion.
    Type: Grant
    Filed: March 27, 2019
    Date of Patent: June 23, 2020
    Assignee: RAYTHEON TECHNOLOGIES CORPORATION
    Inventor: Gordon A. Perrett