Patents by Inventor Gordon Angel

Gordon Angel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11957753
    Abstract: Pharmaceutical compositions for topical application to skin are provided. In some embodiments, the pharmaceutical compositions comprise a corticosteroid and further comprise a liquid oil component comprising one or more dicarboxylic acid esters and/or monocarboxylic acid esters.
    Type: Grant
    Filed: April 30, 2018
    Date of Patent: April 16, 2024
    Assignee: BAUSCH HEALTH IRELAND LIMITED
    Inventors: Arturo Angel, Gordon Dow
  • Patent number: 7723707
    Abstract: Techniques for plasma injection for space charge neutralization of an ion beam are disclosed. In one particular exemplary embodiment, the techniques may be realized as a plasma injection system for space charge neutralization of an ion beam. The plasma injection system may comprise a first array of magnets and a second array of magnets positioned along at least a portion of an ion beam path, the first array being on a first side of the ion beam path and the second array being on a second side of the ion beam path, the first side opposing the second side. At least two adjacent magnets in the first array of magnets may have opposite polarity. The plasma injection system may also comprise a plasma source configured to generate a plasma in a region associated with a portion of the ion beam path by colliding at least some electrons with a gas.
    Type: Grant
    Filed: July 23, 2007
    Date of Patent: May 25, 2010
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Victor M. Benveniste, Gordon Angel, Bon-Woong Koo, Kourosh Saadatmand
  • Publication number: 20090026390
    Abstract: Techniques for plasma injection for space charge neutralization of an ion beam are disclosed. In one particular exemplary embodiment, the techniques may be realized as a plasma injection system for space charge neutralization of an ion beam. The plasma injection system may comprise a first array of magnets and a second array of magnets positioned along at least a portion of an ion beam path, the first array being on a first side of the ion beam path and the second array being on a second side of the ion beam path, the first side opposing the second side. At least two adjacent magnets in the first array of magnets may have opposite polarity. The plasma injection system may also comprise a plasma source configured to generate a plasma in a region associated with a portion of the ion beam path by colliding at least some electrons with a gas.
    Type: Application
    Filed: July 23, 2007
    Publication date: January 29, 2009
    Applicant: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Victor M. Benveniste, Gordon Angel, Bon-Woong Koo, Kourosh Saadatmand
  • Patent number: 7170067
    Abstract: The present invention provides a combined electrostatically suppressed Faraday and energy contamination monitor and related methods for its use. The apparatus of the present invention is capable of selectively measuring two properties of an ion beam, including, for example, a current and a level of energy contamination in a decelerated ion beam. A first aspect of the invention provides an ion beam measurement apparatus comprising an aperture for receiving the ion beam, a negatively biased electrode disposed adjacent to the aperture, a positively biased electrode disposed adjacent to the negatively biased electrode, a selectively biased electrode disposed adjacent to the positively biased electrode, and a collector, wherein the selectively biased electrode may selectively be negatively biased or positively biased.
    Type: Grant
    Filed: March 30, 2005
    Date of Patent: January 30, 2007
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Anthony Renau, Eric Hermanson, Joseph C. Olson, Gordon Angel
  • Publication number: 20060192134
    Abstract: The present invention provides a combined electrostatically suppressed Faraday and energy contamination monitor and related methods for its use. The apparatus of the present invention is capable of selectively measuring two properties of an ion beam, including, for example, a current and a level of energy contamination in a decelerated ion beam. A first aspect of the invention provides an ion beam measurement apparatus comprising an aperture for receiving the ion beam, a negatively biased electrode disposed adjacent to the aperture, a positively biased electrode disposed adjacent to the negatively biased electrode, a selectively biased electrode disposed adjacent to the positively biased electrode, and a collector, wherein the selectively biased electrode may selectively be negatively biased or positively biased.
    Type: Application
    Filed: March 30, 2005
    Publication date: August 31, 2006
    Inventors: Anthony Renau, Eric Hermanson, Joseph Olson, Gordon Angel
  • Publication number: 20060097195
    Abstract: Methods and apparatus are provided for measuring a profile of an ion beam. The apparatus includes an array of beam current sensors, each producing a sensor signal in response to incident ions of the ion beam, a translation mechanism configured to translate the array of beam current sensors along a translation path with respect to the ion beam, and a controller configured to acquire the sensor signals produced by the beam current sensors at a plurality of positions along the translation path, wherein the acquired sensor signals are representative of a two-dimensional profile of the ion beam.
    Type: Application
    Filed: November 5, 2004
    Publication date: May 11, 2006
    Applicant: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Gordon Angel, Edward MacIntosh, Thomas Schaefer
  • Publication number: 20050178981
    Abstract: An ion beam neutral detector system, an ion implanter system including the detector system and a method of detecting ion beam neutrals that ensures an ion implant is meeting contamination requirements are disclosed. The detector includes an energy contamination monitor positioned with in an ion implanter system.
    Type: Application
    Filed: February 11, 2005
    Publication date: August 18, 2005
    Inventors: Anthony Renau, Joseph Olson, Eric Hermanson, Gordon Angel