Abstract: A system and method for capturing and evaluating high-speed serial data streams using conventional component testers includes a high-speed latching comparator coupled to the output of a device under test (DUT). The component tester stimulates the DUT to produce a high-speed serial data stream and strobes the latching comparator at predetermined instants of time relative to the serial data stream. In response, the latching comparator samples the digital state of the serial data stream and holds the sampled state. The component tester reads and stores the held state. The tester samples the serial data stream at multiple locations in this fashion, and takes multiple samples at each location. The tester averages the samples acquired at each location to render a probability function of the serial data stream verses time. The probability function has values that vary between zero and one, corresponding to the average value of the digital readings sampled at each point.