Abstract: The cavities of IC's are inspected for contaminants rising a point source x-ray. The IC's are arranged on a curved surface, approximating the arc formed by the radiation from the point source x-ray. In this way, the IC's may be stood on end with the sides parallel to the x-ray radiation. In this arrangement, the radiation from the x-ray point source passes approximately parallel to the IC size and a clear image of the cavity is achieved without distortion produced by the x-rays passing thou the bottom or the top. Alternately, the curved surface for mounting the IC's may be formed of small straight sections formed at angles approximating the curve.