Patents by Inventor Gordon Moseley Andrews

Gordon Moseley Andrews has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and apparatus for high resolution imaging with reflectors at staggered depths beneath sample
    Patent number: 11016309
    Abstract: A sample may be illuminated in such a way that light passes through the sample, reflects from a set of reflectors, passes through the sample again and travels to a light sensor. The reflectors may be staggered in depth beneath the sample, each reflector being at a different depth. Light reflecting from each reflector, respectively, may arrive at the light sensor during a different time interval than that in which light reflecting from other reflectors arrives—or may have a different phase than that of light reflecting from the other reflectors. The light sensor may separately measure light reflecting from each reflector, respectively. The reflectors may be extremely small, and the separate reflections from the different reflectors may be combined in a super-resolved image. The super-resolved image may have a spatial resolution that is better than that indicated by the diffraction limit.
    Type: Grant
    Filed: July 9, 2019
    Date of Patent: May 25, 2021
    Assignee: Massachusetts Institute of Technology
    Inventors: Barmak Heshmat Dehkordi, Albert Redo-Sanchez, Gordon Moseley Andrews, Ramesh Raskar
  • Methods and apparatus for high resolution imaging with reflectors at staggered depths beneath sample
    Publication number: 20190331932
    Abstract: A sample may be illuminated in such a way that light passes through the sample, reflects from a set of reflectors, passes through the sample again and travels to a light sensor. The reflectors may be staggered in depth beneath the sample, each reflector being at a different depth. Light reflecting from each reflector, respectively, may arrive at the light sensor during a different time interval than that in which light reflecting from other reflectors arrives—or may have a different phase than that of light reflecting from the other reflectors. The light sensor may separately measure light reflecting from each reflector, respectively. The reflectors may be extremely small, and the separate reflections from the different reflectors may be combined in a super-resolved image. The super-resolved image may have a spatial resolution that is better than that indicated by the diffraction limit.
    Type: Application
    Filed: July 9, 2019
    Publication date: October 31, 2019
    Inventors: Barmak Heshmat Dehkordi, Albert Redo-Sanchez, Gordon Moseley Andrews, Ramesh Raskar
  • Methods and apparatus for high resolution imaging with reflectors at staggered depths beneath sample
    Patent number: 10386650
    Abstract: A sample may be illuminated in such a way that light passes through the sample, reflects from a set of reflectors, passes through the sample again and travels to a light sensor. The reflectors may be staggered in depth beneath the sample, each reflector being at a different depth. Light reflecting from each reflector, respectively, may arrive at the light sensor during a different time interval than that in which light reflecting from other reflectors arrives—or may have a different phase than that of light reflecting from the other reflectors. The light sensor may separately measure light reflecting from each reflector, respectively. The reflectors may be extremely small, and the separate reflections from the different reflectors may be combined in a super-resolved image. The super-resolved image may have a spatial resolution that is better than that indicated by the diffraction limit.
    Type: Grant
    Filed: October 23, 2017
    Date of Patent: August 20, 2019
    Assignee: Massachusetts Institute of Technology
    Inventors: Barmak Heshmat Dehkordi, Albert Redo-Sanchez, Gordon Moseley Andrews, Ramesh Raskar
  • Methods and apparatus for high resolution imaging with reflectors at staggered depths beneath sample
    Publication number: 20180113321
    Abstract: A sample may be illuminated in such a way that light passes through the sample, reflects from a set of reflectors, passes through the sample again and travels to a light sensor. The reflectors may be staggered in depth beneath the sample, each reflector being at a different depth. Light reflecting from each reflector, respectively, may arrive at the light sensor during a different time interval than that in which light reflecting from other reflectors arrives—or may have a different phase than that of light reflecting from the other reflectors. The light sensor may separately measure light reflecting from each reflector, respectively. The reflectors may be extremely small, and the separate reflections from the different reflectors may be combined in a super-resolved image. The super-resolved image may have a spatial resolution that is better than that indicated by the diffraction limit.
    Type: Application
    Filed: October 23, 2017
    Publication date: April 26, 2018
    Inventors: Barmak Heshmat Dehkordi, Albert Redo-Sanchez, Gordon Moseley Andrews, Ramesh Raskar