Abstract: A high speed bipolar multiplexer circuit adds less than ten picoseconds delay to the data or test paths. The multiplexer circuit incorporates a low gain linear amplifier which is completely stable and compensates for any level losses through the input emitter followers. The minimal delay introduced in the system data paths and the good isolation between system data inputs and test data inputs matches the performance of the logic and memory circuits of the chips in which multiplexer circuits are incorporated.

Abstract: Method and means for validating any BSM in main storage while main storage remains available for normal system operation by all CPUs in the system. The system has plural sets of BSMs in which any set can be operationally fenced from system operation in order to validate any BSM in the fenced set, while the system normally operates with the unfenced set(s) of BSMs comprising main storage. Each BSM set has a BSM controller which is integrated with a hardware BSM tester. All cells in and the addressing circuits to any BSM can be tested by incrementing line addresses through the BSM while comparing a true pattern and then a complement pattern, and then decrementing line addresses through the BSM comparing the complement pattern and then the true pattern. The BSM testers use level sensitive scan design (LSSD) circuits in the BSM controller to serially communicate with a system service processor in response to commands from the service processor and interrupt signals from the BSM tester.