Abstract: Methods for measuring a property of a sample material present at an interface of an emerging medium in a spectroscopic device include a sensor (10) featuring at least one dielectric member (14) disposed upon a entrant medium (12), with the dielectric member being of an optical thickness selected to produce an observable interference effect for an incident angle of light below the critical angle of total internal reflection at the interface with the dielectric member (14). The dielectric member (14) of the sensor device (10) may be modified and functionalized for binding of a sample analyte by disposing a sensing surface area (38, 40, 42) upon it. Moreover, an metal layer (18) may be added to an entrant medium (20) to produce a sensor (16) that generates observable optical phenomena both above (resonance) and below (interference) a given critical angle.

Abstract: Methods for measuring a property of a sample material present at an interface of an emerging medium in a spectroscopic device include a sensor (10) featuring at least one dielectric member (14) disposed upon a entrant medium (12), with the dielectric member being of an optical thickness selected to produce an observable interference effect for an incident angle of light below the critical angle of total internal reflection at the interface with the dielectric member (14). The dielectric member (14) of the sensor device (10) may be modified and functionalized for binding of a sample analyte by disposing a sensing surface area (38, 40, 42) upon it. Moreover, an metal layer (18) may be added to an entrant medium (20) to produce a sensor (16) that generates observable optical phenomena both above (resonance) and below (interference) a given critical angle.

Abstract: A metallic (or semiconductor) layer (or layers) is used with either a prism or a grating so as to provide a surface plasmon wave under total reflection conditions of an incident light of predetermined wavelength outside the visible spectrum. The metal layer is selected with a refractive index as small as possible and an extinction coefficient as large as possible within the wavelength of interest and is covered with a solid dielectric layer characterized by predetermined optical parameters. This layer may contain one or several layers of different materials and plays the role of a light waveguide that generates waveguide modes coupled to surface plasmons, resulting in a new set of resonances excited by both p- and s-polarized excitation light and characterized by much narrower spectra than produced by conventional SPR. In a particular embodiment of the invention, the dielectric layer may be designed to serve both as a waveguide and at the same time as an electrode.

Abstract: A metallic (or semiconductor) layer is used with a prism to provide a surface plasmon wave under total reflection conditions of an incident light of predetermined wavelength outside the visible spectrum. The metal layer is selected with a refractive index as small as possible and an extinction coefficient as large as possible within the wavelength of interest and is covered with a solid dielectric layer characterized by predetermined optical parameters. This layer plays the role of a light waveguide that generates waveguide modes coupled to surface plasmons, resulting in a new set of resonances excited by both p- and s-polarized excitation light and characterized by much narrower spectra than produced by conventional SPR. In a particular embodiment of the invention, the dielectric layer is designed to serve both as a waveguide and as an electrode for monitoring simultaneously electrical characteristics and optical parameters of thin films and interfaces.

Abstract: A conventional SPR spectroscopic device, consisting of a metallic film used with a prism to provide a surface plasmon wave, is modified by coating the film with a dielectric layer. According to one aspect of the invention, such additional layer of dielectric material functions as an optical amplifier that produces an increased sensitivity and enhanced spectroscopic capabilities in SPR. According to another aspect of the invention, the added dielectric layer can be used as a matrix for adsorbing and immobilizing the sensing materials in sensor applications. Furthermore, the dielectric layer provides a shield for both mechanical and chemical protection of the metal layer, thereby preventing the rapid deterioration that commonly accompanies such detectors. In its simplest embodiment, the invention includes only one dielectric layer; in other embodiments, a variety of multi-layer configurations may be implemented for different purposes with diverse dielectric materials.

Abstract: A method for the formation of a biocompatible film composed of a self-assembled bilayer membrane deposited on a planar surface. This bilayer membrane is capable of immobilizing materials to be analyzed in an environment very similar to their native state. Materials so immobilized may be subject to any of a number of analytical techniques.